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Razvigor Ossikovski
Razvigor Ossikovski
professeur
Verified email at polytechnique.edu
Title
Cited by
Cited by
Year
Polarized light and the Mueller matrix approach
JJ Gil, R Ossikovski
CRC press, 2022
2482022
Spectroscopic ellipsometry and polarimetry for materials and systems analysis at the nanometer scale: state-of-the-art, potential, and perspectives
M Losurdo, M Bergmair, G Bruno, D Cattelan, C Cobet, A De Martino, ...
Journal of Nanoparticle Research 11 (7), 1521-1554, 2009
2212009
Differential matrix formalism for depolarizing anisotropic media
R Ossikovski
Optics letters 36 (12), 2330-2332, 2011
2132011
Analysis of depolarizing Mueller matrices through a symmetric decomposition
R Ossikovski
JOSA A 26 (5), 1109-1118, 2009
1622009
Forward and reverse product decompositions of depolarizing Mueller matrices
R Ossikovski, A De Martino, S Guyot
Optics letters 32 (6), 689-691, 2007
1572007
Ultra-low-threshold continuous-wave and pulsed lasing in tensile-strained GeSn alloys
A Elbaz, D Buca, N von den Driesch, K Pantzas, G Patriarche, ...
Nature Photonics 14 (6), 375-382, 2020
1142020
Simple model for the polarization effects in tip-enhanced Raman spectroscopy
R Ossikovski, Q Nguyen, G Picardi
Physical Review B 75 (4), 045412, 2007
1062007
Recent advances in germanium emission
P Boucaud, M El Kurdi, A Ghrib, M Prost, M De Kersauson, S Sauvage, ...
Photonics Research 1 (3), 102-109, 2013
902013
All‐Around SiN Stressor for High and Homogeneous Tensile Strain in Germanium Microdisk Cavities
A Ghrib, M El Kurdi, M Prost, S Sauvage, X Checoury, G Beaudoin, ...
Advanced Optical Materials 3 (3), 353-358, 2015
892015
Advanced Mueller ellipsometry instrumentation and data analysis
E Garcia-Caurel, R Ossikovski, M Foldyna, A Pierangelo, B Drévillon, ...
Ellipsometry at the Nanoscale, 31-143, 2013
762013
Measurement of the absorption edge of thick transparent substrates using the incoherent reflection model and spectroscopic UV–visible–near IR ellipsometry
M Kildemo, R Ossikovski, M Stchakovsky
Thin Solid Films 313, 108-113, 1998
751998
Control of tensile strain in germanium waveguides through silicon nitride layers
A Ghrib, M De Kersauson, M El Kurdi, R Jakomin, G Beaudoin, ...
Applied Physics Letters 100 (20), 201104, 2012
742012
High quality tensile-strained -doped germanium thin films grown on InGaAs buffer layers by metal-organic chemical vapor deposition
R Jakomin, M De Kersauson, M El Kurdi, L Largeau, O Mauguin, ...
Applied Physics Letters 98 (9), 091901, 2011
742011
Depolarizing Mueller matrices: how to decompose them?
R Ossikovski, M Anastasiadou, S Ben Hatit, E Garcia‐Caurel, ...
physica status solidi (a) 205 (4), 720-727, 2008
682008
Direct band gap germanium microdisks obtained with silicon nitride stressor layers
M El Kurdi, M Prost, A Ghrib, S Sauvage, X Checoury, G Beaudoin, ...
ACS photonics 3 (3), 443-448, 2016
652016
Statistical meaning of the differential Mueller matrix of depolarizing homogeneous media
R Ossikovski, O Arteaga
Optics letters 39 (15), 4470-4473, 2014
652014
Billion-fold increase in tip-enhanced Raman signal
HK Wickramasinghe, M Chaigneau, R Yasukuni, G Picardi, R Ossikovski
ACS nano 8 (4), 3421-3426, 2014
632014
Comparative study of differential matrix and extended polar decomposition formalisms for polarimetric characterization of complex tissue-like turbid media
S Kumar, H Purwar, R Ossikovski, IA Vitkin, N Ghosh
Journal of biomedical optics 17 (10), 105006, 2012
622012
Tip enhanced Raman spectroscopy on azobenzene thiol self‐assembled monolayers on Au (111)
G Picardi, M Chaigneau, R Ossikovski, C Licitra, G Delapierre
Journal of Raman Spectroscopy: An International Journal for Original Work in …, 2009
602009
Interpretation of nondepolarizing Mueller matrices based on singular-value decomposition
R Ossikovski
JOSA A 25 (2), 473-482, 2008
512008
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