| Design optimization of three-stacked nanosheet FET from self-heating effects perspective S Rathore, RK Jaisawal, PN Kondekar, N Bagga IEEE Transactions on Device and Materials Reliability 22 (3), 396-402, 2022 | 35 | 2022 |
| Insights into the operation of negative capacitance FinFET for low power logic applications RK Jaisawal, PN Kondekar, S Yadav, P Upadhyay, B Awadhiya, ... Microelectronics Journal 119, 105321, 2022 | 30 | 2022 |
| Assessing the analog/RF and linearity performances of FinFET using high threshold voltage techniques RK Jaisawal, S Rathore, PN Kondekar, S Yadav, B Awadhiya, ... Semiconductor Science and Technology 37 (5), 055010, 2022 | 26 | 2022 |
| Role of temperature on linearity and analog/RF performance merits of a negative capacitance FinFET RK Jaisawal, S Rathore, N Gandhi, PN Kondekar, N Bagga Semiconductor Science and Technology 37 (11), 115003, 2022 | 17 | 2022 |
| Investigation of ambient temperature and thermal contact resistance induced self-heating effects in nanosheet FET S Rathore, RK Jaisawal, P Suryavanshi, PN Kondekar Semiconductor Science and Technology 37 (5), 055019, 2022 | 16 | 2022 |
| Demonstration of a nanosheet FET with high thermal conductivity material as buried oxide: Mitigation of self-heating effect S Rathore, RK Jaisawal, PN Kondekar, N Bagga IEEE Transactions on Electron Devices 70 (4), 1970-1976, 2023 | 15 | 2023 |
| Trap and self-heating effect based reliability analysis to reveal early aging effect in nanosheet FET S Rathore, RK Jaisawal, PN Kondekar, N Bagga Solid-State Electronics 200, 108546, 2023 | 15 | 2023 |
| Reliability of TCAD study for HfO2-doped Negative capacitance FinFET with different Material-Specific dopants RK Jaisawal, S Rathore, PN Kondekar, N Bagga Solid-State Electronics 199, 108531, 2023 | 15 | 2023 |
| Self-heating and interface traps assisted early aging revelation and reliability analysis of negative capacitance FinFET RK Jaisawal, S Rathore, N Gandhi, PN Kondekar, S Banchhor, ... 2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM), 1-3, 2023 | 8 | 2023 |
| Analog/rf and linearity performance assessment of a negative capacitance finfet using high threshold voltage techniques RK Jaisawal, S Rathore, PN Kondekar, N Bagga IEEE Transactions on Nanotechnology, 2023 | 6 | 2023 |
| Substrate BOX engineering to mitigate the self-heating induced degradation in nanosheet transistor S Rathore, RK Jaisawal, N Gandhi, PN Kondekar, N Bagga Microelectronics Journal 129, 105590, 2022 | 6 | 2022 |
| Gate oxide induced reliability assessment of junctionless FinFET-based hydrogen Gas sensor N Gandhi, RK Jaisawal, S Rathore, PN Kondekar, A Dixit, N Kumar, ... 2023 IEEE SENSORS, 1-4, 2023 | 3 | 2023 |
| Investigation of Analog/RF and linearity performance with self-heating effect in nanosheet FET S Rathore, RK Jaisawal, PN Kondekar, N Bagga Microelectronics Journal 139, 105904, 2023 | 2 | 2023 |
| Unveiling the self-heating and process variation reliability of a junctionless FinFET-based hydrogen gas sensor N Gandhi, S Rathore, RK Jaisawal, PN Kondekar, S Dey, N Bagga IEEE Sensors Letters, 2023 | 2 | 2023 |
| An asynchronous analog to digital converter for video camera applications R Sunil, RK Siddharth, NK YB, MH Vasantha 2019 IEEE Computer Society Annual Symposium on VLSI (ISVLSI), 175-180, 2019 | 2 | 2019 |
| An Asynchronous Analog to Digital Converter for Surveillance Camera Applications RK Siddharth, R Sunil, NK YB, MH Vasantha, E Bonizzoni 2018 IEEE Computer Society Annual Symposium on VLSI (ISVLSI), 164-169, 2018 | 2 | 2018 |
| Self-Heating Aware Threshold Voltage Modulation Conforming to Process and Ambient Temperature Variation for Reliable Nanosheet FET S Rathore, RK Jaisawal, PN Kondekar, N Gandhi, S Banchhor, YS Song, ... 2023 IEEE International Reliability Physics Symposium (IRPS), 1-5, 2023 | 1 | 2023 |
| Demonstration of a junctionless negative capacitance FinFET-based hydrogen gas sensor: A reliability perspective N Gandhi, RK Jaisawal, S Rathore, PN Kondekar, S Banchhor, N Bagga 2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM), 1-3, 2023 | 1 | 2023 |
| Effect of scaling on passive voltage amplification in FE-DE hetero structure B Awadhiya, PN Kondekar, S Yadav, P Upadhyay, RK Jaisawal, ... 2021 International Conference on Control, Automation, Power and Signal …, 2021 | 1 | 2021 |
| Unveiling the reliability of negative capacitance FinFET with confrontation of different HfO2-ferroelectric dopants RK Jaisawal, S Rathore, PN Kondekar, N Bagga Solid-State Electronics 215, 108896, 2024 | | 2024 |
Rajeev Kumar JaisawalResearch Scholar PDPM IIITDM JabalpurVerified email at iiitdmj.ac.in
