| Preplacement net length and timing estimation by customized graph neural network Z Xie, R Liang, X Xu, J Hu, CC Chang, J Pan, Y Chen IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2022 | 28 | 2022 |
| Automatic routability predictor development using neural architecture search CC Chang, J Pan, T Zhang, Z Xie, J Hu, W Qi, CW Lin, R Liang, J Mitra, ... 2021 IEEE/ACM International Conference On Computer Aided Design (ICCAD), 1-9, 2021 | 28 | 2021 |
| DEEP: Developing extremely efficient runtime on-chip power meters Z Xie, S Li, M Ma, CC Chang, J Pan, Y Chen, J Hu Proceedings of the 41st IEEE/ACM International Conference on Computer-Aided …, 2022 | 15 | 2022 |
| Towards collaborative intelligence: Routability estimation based on decentralized private data J Pan, CC Chang, Z Xie, A Li, M Tang, T Zhang, J Hu, Y Chen Proceedings of the 59th ACM/IEEE Design Automation Conference, 961-966, 2022 | 14 | 2022 |
| PANDA: Architecture-level power evaluation by unifying analytical and machine learning solutions Q Zhang, S Li, G Zhou, J Pan, CC Chang, Y Chen, Z Xie 2023 IEEE/ACM International Conference on Computer Aided Design (ICCAD), 01-09, 2023 | 11 | 2023 |
| LaMAGIC: Language-Model-based Topology Generation for Analog Integrated Circuits CC Chang, Y Shen, S Fan, J Li, S Zhang, N Cao, Y Chen, X Zhang Proceedings of the 41st International Conference on Machine Learning, PMLR …, 2024 | 7 | 2024 |
| Fully automated machine learning model development for analog placement quality prediction CC Chang, J Pan, Z Xie, Y Li, Y Lin, J Hu, Y Chen Proceedings of the 28th Asia and South Pacific Design Automation Conference …, 2023 | 6 | 2023 |
| Time-division multiplexing based system-level FPGA routing WK Liu, MH Chen, CM Chang, CC Chang, YW Chang 2021 IEEE/ACM International Conference On Computer Aided Design (ICCAD), 1-6, 2021 | 5 | 2021 |
| Rethink before releasing your model: ML model extraction attack in EDA CC Chang, J Pan, Z Xie, J Hu, Y Chen Proceedings of the 28th Asia and South Pacific Design Automation Conference …, 2023 | 4 | 2023 |
| The Dark Side: Security and Reliability Concerns in Machine Learning for EDA Z Xie, J Pan, CC Chang, J Hu, Y Chen IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2022 | 4 | 2022 |
| The dark side: Security concerns in machine learning for EDA Z Xie, J Pan, CC Chang, Y Chen arXiv preprint arXiv:2203.10597, 2022 | 4 | 2022 |
| Robustify ML-based lithography hotspot detectors J Pan, CC Chang, Z Xie, J Hu, Y Chen Proceedings of the 41st IEEE/ACM International Conference on Computer-Aided …, 2022 | 3 | 2022 |
| Deep learning for routability Z Xie, J Pan, CC Chang, R Liang, EC Barboza, Y Chen Machine learning applications in electronic design automation, 35-61, 2022 | 3 | 2022 |
| EDALearn: A Comprehensive RTL-to-Signoff EDA Benchmark for Democratized and Reproducible ML for EDA Research J Pan, CC Chang, Z Xie, Y Chen arXiv preprint arXiv:2312.01674, 2023 | 2 | 2023 |
| DRC-Coder: Automated DRC Checker Code Generation Using LLM Autonomous Agent CC Chang, CT Ho, Y Li, Y Chen, H Ren arXiv preprint arXiv:2412.05311, 2024 | 1 | 2024 |
| Improving Routability Prediction via NAS Using a Smooth One-shot Augmented Predictor A Sridhar, CC Chang, J Zhang, Y Chen arXiv preprint arXiv:2411.14296, 2024 | 1 | 2024 |
| A Survey of Research in Large Language Models for Electronic Design Automation J Pan, G Zhou, CC Chang, I Jacobson, J Hu, Y Chen ACM Transactions on Design Automation of Electronic Systems, 2025 | | 2025 |
| PRICING: Privacy-Preserving Circuit Data Sharing Framework for Lithographic Hotspot Detection CC Chang, WH Lin, J Pan, G Zhou, Z Xie, J Hu, Y Chen | | 2025 |
| Towards Fully Automated Machine Learning for Routability Estimator Development CC Chang, J Pan, Z Xie, T Zhang, J Hu, Y Chen IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2023 | | 2023 |
Yiran ChenJohn Cocke Distinguished Professor of Electrical and Computer Engineering, Duke UniversityVerified email at duke.edu
