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Holger Rücker
Holger Rücker
IHP, Innovations for High Performance Microelelectronics
Verified email at ihp-microelectronics.com
Title
Cited by
Cited by
Year
Microscopic calculation of the electron-phonon interaction in quantum wells
H Rücker, E Molinari, P Lugli
Physical Review B 45 (12), 6747, 1992
3281992
SiGe HBT technology with fT/fmax of 300GHz/500GHz and 2.0 ps CML gate delay
B Heinemann, R Barth, D Bolze, J Drews, GG Fischer, A Fox, O Fursenko, ...
2010 International Electron Devices Meeting, 30.5. 1-30.5. 4, 2010
3042010
Half-terahertz sige bicmos technology
H Rücker, B Heinemann, A Fox
2012 IEEE 12th Topical Meeting on Silicon Monolithic Integrated Circuits in …, 2012
2522012
SiGe HBT with fx/fmax of 505 GHz/720 GHz
B Heinemann, H Rücker, R Barth, F Bärwolf, J Drews, GG Fischer, A Fox, ...
2016 IEEE International Electron Devices Meeting (IEDM), 3.1. 1-3.1. 4, 2016
2272016
A 0.13SiGe BiCMOS Technology Featuring f/fof 240/330 GHz and Gate Delays Below 3 ps
H Rucker, B Heinemann, W Winkler, R Barth, J Borngraber, J Drews, ...
IEEE Journal of Solid-State Circuits 45 (9), 1678-1686, 2010
2212010
Electron-phonon interaction in quasi-two-dimensional systems
H Rücker, E Molinari, P Lugli
Physical Review B 44 (7), 3463, 1991
2181991
Anharmonic Keating model for group-IV semiconductors with application to the lattice dynamics in alloys of Si, Ge, and C
H Rücker, M Methfessel
Physical Review B 52 (15), 11059, 1995
2141995
Suppressed diffusion of boron and carbon in carbon-rich silicon
H Rücker, B Heinemann, W Röpke, R Kurps, D Krüger, G Lippert, ...
Applied Physics Letters 73 (12), 1682-1684, 1998
1831998
SiGe HBT and BiCMOS process integration optimization within the DOTSEVEN project
J Böck, K Aufinger, S Boguth, C Dahl, H Knapp, W Liebl, D Manger, ...
2015 IEEE Bipolar/BiCMOS Circuits and Technology Meeting-BCTM, 121-124, 2015
1632015
Strain-stabilized highly concentrated pseudomorphic Si 1− x C x layers in Si
H Rücker, M Methfessel, E Bugiel, HJ Osten
Physical review letters 72 (22), 3578, 1994
1441994
Growth and properties of strained Si1-x-yGexCy layers
SC Jain, HJ Osten, B Dietrich, H Rucker
Semiconductor science and technology 10 (10), 1289, 1995
1301995
Novel collector design for high-speed SiGe: C HBTs
B Heinemann, H Rucker, R Barth, J Bauer, D Bolze, E Bugiel, J Drews, ...
Digest. International Electron Devices Meeting,, 775-778, 2002
1272002
A 0.53 THz reconfigurable source module with up to 1 mW radiated power for diffuse illumination in terahertz imaging applications
UR Pfeiffer, Y Zhao, J Grzyb, R Al Hadi, N Sarmah, W Förster, H Rücker, ...
IEEE Journal of Solid-State Circuits 49 (12), 2938-2950, 2014
1242014
High-performance BiCMOS technologies without epitaxially-buried subcollectors and deep trenches
B Heinemann, R Barth, D Knoll, H Rücker, B Tillack, W Winkler
Semiconductor Science and Technology 22 (1), S153, 2006
1132006
Si/SiGe: C and InP/GaAsSb heterojunction bipolar transistors for THz applications
P Chevalier, M Schröter, CR Bolognesi, V d'Alessandro, M Alexandrova, ...
Proceedings of the IEEE 105 (6), 1035-1050, 2017
1122017
SiGe BiCMOS technology with 3.0 ps gate delay
H Rucker, B Heinemann, R Barth, J Bauer, K Blum, D Bolze, J Drews, ...
2007 IEEE International Electron Devices Meeting, 651-654, 2007
1002007
Lattice distortion in a strain-compensated Si 1− x− y Ge x C y layer on silicon
B Dietrich, HJ Osten, H Rücker, M Methfessel, P Zaumseil
Physical Review B 49 (24), 17185, 1994
881994
14.5 A 0.53 THz reconfigurable source array with up to 1mW radiated power for terahertz imaging applications in 0.13 μm SiGe BiCMOS
UR Pfeiffer, Y Zhao, J Grzyb, R Al Hadi, N Sarmah, W Förster, H Rücker, ...
2014 IEEE International Solid-State Circuits Conference Digest of Technical …, 2014
862014
Characterization of Si//Si quantum wells by space-charge spectroscopy
K Schmalz, IN Yassievich, H Rücker, HG Grimmeiss, H Frankenfeld, ...
Physical review B 50 (19), 14287, 1994
851994
SiGe BiCMOS current status and future trends in Europe
P Chevalier, W Liebl, H Rücker, A Gauthier, D Manger, B Heinemann, ...
2018 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and …, 2018
792018
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