Yotam Gil
Yotam Gil
Elbit System, Israel
Verified email at elbitsystems.com
Title
Cited by
Cited by
Year
Properties of solid state devices with mobile ionic defects. Part I: The effects of motion, space charge and contact potential in metal| semiconductor| metal devices
Y Gil, OM Umurhan, I Riess
Solid State Ionics 178 (1-2), 1-12, 2007
482007
Microtubules, motor proteins, and anomalous mean squared displacements
H Salman, Y Gil, R Granek, M Elbaum
Chemical physics 284 (1-2), 389-397, 2002
392002
Semi-conductors with mobile ions show a new type of IV relations
Z Rosenstock, I Feldman, Y Gil, I Riess
Journal of electroceramics 14 (3), 205-212, 2005
232005
Properties of a solid state device with mobile dopants: Analytic analysis for the thin film device
Y Gil, OM Umurhan, I Riess
Journal of Applied Physics 104 (8), 084504, 2008
202008
I–V relations in nano thin semi-conductors with mobile acceptors or donors
Y Gil, OM Umurhan, Y Tsur, I Riess
Solid State Ionics 179 (1-6), 24-32, 2008
102008
Quasi progressive lenses for eyewear
Y Carmon, Y Gil, L Gleser, A Shur
US Patent US9618774B2, 2015
82015
Properties of solid state devices with significant impurity hopping conduction
Y Gil, Y Tsur, OM Umurhan, I Riess
Journal of Physics D: Applied Physics 41 (13), 135106, 2008
72008
Recent calculations and measurements of I–V relations in simple devices based on thin nano versus thick layers of semiconductors with mobile acceptors or donors
Y Gil, OM Umurhan, Y Tsur, I Riess
Solid State Ionics 179 (21-26), 1187-1193, 2008
32008
Hydrodynamic response of rotationally supported flows in the small shearing box model
A Sternberg, OM Umurhan, Y Gil, O Regev
Astronomy & Astrophysics 486 (2), 341-345, 2008
32008
Determination of the Parameters that Control Oxidation Using Optical Interference, Applied to the Two Phase Oxide Scale on Copper
Y Gil, I Riess
Zeitschrift für Physikalische Chemie 223 (10-11), 1285-1309, 2009
22009
Quasi progressive lenses for eyewear
Y Carmon, Y Gil, L Gleser, A Shur
US Patent App. 16/527,704, 2020
2020
Self-administrated testing of eyeglasses
AM Gamliel, Z Katzman, A Netzer, Y Gil, MM MOSHE, S Michael
US Patent App. 16/077,668, 2020
2020
Methods and systems for testing of eyeglasses
AM Gamliel, Z Katzman, A Netzer, Y Gil, MM MOSHE, S Michael
US Patent App. 16/077,646, 2019
2019
Method and system for improving an ophthalmic prescription
Y Carmon, L Gleser, Y Gil
US Patent 10,429,669, 2019
2019
Current-voltage Relations and Point Defect Distribution in Mixed-ionic-electronic-conductors
Y Gil
Technion-Israel Institute of Technology, Department of Physics, 2009
2009
The system can't perform the operation now. Try again later.
Articles 1–15