Follow
Patrick R. Mickel
Patrick R. Mickel
General Atomics
Verified email at ga-asi.com
Title
Cited by
Cited by
Year
A physical model of switching dynamics in tantalum oxide memristive devices
PR Mickel, AJ Lohn, B Joon Choi, J Joshua Yang, MX Zhang, ...
Applied Physics Letters 102 (22), 2013
1012013
Initial Assessment of the Effects of Radiation on the Electrical Characteristics of Memristive Memories
MJ Marinella, SM Dalton, PR Mickel, PED Dodd, MR Shaneyfelt, ...
IEEE Transactions on Nuclear Science 59 (6), 2987-2994, 2012
932012
Isothermal Switching and Detailed Filament Evolution in Memristive Systems
PR Mickel, AJ Lohn, CD James, MJ Marinella
Advanced Materials 26 (26), 4486–4490, 2014
682014
Growth and characterization of multiferroic BiMnO3 thin films
H Jeen, G Singh-Bhalla, PR Mickel, K Voigt, C Morien, S Tongay, ...
Journal of Applied Physics 109 (7), 2011
542011
A Comparison of the Radiation Response of and Memristors
DR Hughart, AJ Lohn, PR Mickel, SM Dalton, PE Dodd, MR Shaneyfelt, ...
IEEE Transactions on Nuclear Science 60 (6), 4512-4519, 2013
512013
Evaluating tantalum oxide stoichiometry and oxidation states for optimal memristor performance
MT Brumbach, PR Mickel, AJ Lohn, AJ Mirabal, MA Kalan, JE Stevens, ...
Journal of Vacuum Science & Technology A 32 (5), 2014
472014
Reactive sputtering of substoichiometric Ta2Ox for resistive memory applications
JE Stevens, AJ Lohn, SA Decker, BL Doyle, PR Mickel, MJ Marinella
Journal of Vacuum Science & Technology A 32 (2), 2014
472014
Optimizing TaOx memristor performance and consistency within the reactive sputtering “forbidden region”
AJ Lohn, JE Stevens, PR Mickel, MJ Marinella
Applied Physics Letters 103 (6), 2013
422013
Memristive switching: physical mechanisms and applications
PR Mickel, AJ Lohn, MJ Marinella
Modern Physics Letters B 28 (10), 1430003, 2014
382014
Analytical estimations for thermal crosstalk, retention, and scaling limits in filamentary resistive memory
AJ Lohn, PR Mickel, MJ Marinella
Journal of Applied Physics 115 (23), 2014
292014
Detection and characterization of multi-filament evolution during resistive switching
PR Mickel, AJ Lohn, MJ Marinella
Applied Physics Letters 105 (5), 2014
282014
A CMOS compatible, forming free TaOx ReRAM
AJ Lohn, JE Stevens, PR Mickel, DR Hughart, MJ Marinella
ECS Transactions 58 (5), 59, 2013
282013
The Susceptibility of-Based Memristors to High Dose Rate Ionizing Radiation and Total Ionizing Dose
ML McLain, HP Hjalmarson, TJ Sheridan, PR Mickel, D Hanson, ...
IEEE Transactions on Nuclear Science 61 (6), 2997-3004, 2014
182014
Total ionizing dose and displacement damage effects on TaOx memristive memories
DR Hughart, SM Dalton, PR Mickel, PE Dodd, MR Shaneyfelt, E Bielejec, ...
2013 IEEE Aerospace Conference, 1-10, 2013
182013
Methods for resistive switching of memristors
PR Mickel, CD James, A Lohn, M Marinella, AH Hsia
US Patent 9,336,870, 2016
162016
Three-dimensional fully-coupled electrical and thermal transport model of dynamic switching in oxide memristors
X Gao, D Mamaluy, PR Mickel, M Marinella
ECS Transactions 69 (5), 183, 2015
162015
Dynamics of percolative breakdown mechanism in tantalum oxide resistive switching
AJ Lohn, PR Mickel, MJ Marinella
Applied Physics Letters 103 (17), 2013
162013
Proximate transition temperatures amplify linear magnetoelectric coupling in strain-disordered multiferroic BiMnO 3
PR Mickel, H Jeen, P Kumar, A Biswas, AF Hebard
Physical Review B 93 (13), 134205, 2016
152016
Modeling of filamentary resistive memory by concentric cylinders with variable conductivity
AJ Lohn, PR Mickel, MJ Marinella
Applied Physics Letters 105 (18), 2014
122014
Degenerate resistive switching and ultrahigh density storage in resistive memory
PR Mickel, AJ Lohn, CD James, MJ Marinella
Applied Physics Letters 105 (10), 103501, 2014
112014
The system can't perform the operation now. Try again later.
Articles 1–20