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Andrew P. Warren, PhD
Andrew P. Warren, PhD
Plasmonics inc.
Verified email at plasmonics-inc.com
Title
Cited by
Cited by
Year
Surface and grain-boundary scattering in nanometric Cu films
T Sun, B Yao, AP Warren, K Barmak, MF Toney, RE Peale, KR Coffey
Phys. Rev. B 81 (15), 155454-1, 2010
1992010
Comparison of the agglomeration behavior of thin metallic films on SiO2
PR Gadkari, AP Warren, RM Todi, RV Petrova, KR Coffey
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 23 (4 …, 2005
1492005
Dominant role of grain boundary scattering in the resistivity of nanometric Cu films
T Sun, B Yao, AP Warren, K Barmak, MF Toney, RE Peale, KR Coffey
Physical Review B 79 (4), 041402, 2009
1182009
Phase, grain structure, stress, and resistivity of sputter-deposited tungsten films
D Choi, B Wang, S Chung, X Liu, A Darbal, A Wise, NT Nuhfer, K Barmak, ...
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 29 (5 …, 2011
942011
Electron mean free path of tungsten and the electrical resistivity of epitaxial (110) tungsten films
D Choi, CS Kim, D Naveh, S Chung, AP Warren, NT Nuhfer, MF Toney, ...
Physical Review B 86 (4), 045432, 2012
872012
Surface and grain boundary scattering in nanometric Cu thin films: A quantitative analysis including twin boundaries
K Barmak, A Darbal, KJ Ganesh, PJ Ferreira, JM Rickman, T Sun, B Yao, ...
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 32 (6 …, 2014
672014
Classical size effect in oxide-encapsulated Cu thin films: Impact of grain boundaries versus surfaces on resistivity
T Sun, B Yao, AP Warren, V Kumar, S Roberts, K Barmak, KR Coffey
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 26 (4 …, 2008
592008
Grain boundary character distribution of nanocrystalline Cu thin films using stereological analysis of transmission electron microscope orientation maps
AD Darbal, KJ Ganesh, X Liu, SB Lee, J Ledonne, T Sun, B Yao, ...
Microscopy and Microanalysis 19 (1), 111-119, 2013
502013
Aluminum Impurity Diffusion in Magnesium
S Brennan, AP Warren, KR Coffey, N Kulkarni, P Todd, M Kilmov, Y Sohn
Journal of phase equilibria and diffusion 33 (2), 121-125, 2012
452012
Experimental study of interaction of laser radiation with silver nanoparticles in SiO2 matrix
M Sendova, M Sendova-Vassileva, JC Pivin, H Hofmeister, K Coffey, ...
Journal of nanoscience and nanotechnology 6 (3), 748-755, 2006
442006
High contrast hollow-cone dark field transmission electron microscopy for nanocrystalline grain size quantification
B Yao, T Sun, A Warren, H Heinrich, K Barmak, KR Coffey
Micron 41 (3), 177-182, 2010
432010
Dual band sensitivity enhancements of a VO x microbolometer array using a patterned gold black absorber
EM Smith, D Panjwani, J Ginn, AP Warren, C Long, P Figuieredo, C Smith, ...
Applied Optics 55 (8), 2071-2078, 2016
342016
Investigation of oxygen annealing effects on RF sputter deposited SiC thin films
RM Todi, KB Sundaram, AP Warren, K Scammon
Solid-state electronics 50 (7-8), 1189-1193, 2006
252006
X-ray photoelectron spectroscopy analysis of oxygen annealed radio frequency sputter deposited SiCN thin films
RM Todi, AP Warren, KB Sundaram, KR Coffey
Journal of The Electrochemical Society 153 (7), G640-G643, 2006
182006
Characterization of Pt-Ru binary alloy thin films for work function tuning
RM Todi, AP Warren, KB Sundaram, K Barmak, KR Coffey
IEEE electron device letters 27 (7), 542-545, 2006
172006
Comparison of crystal orientation mapping-based and image-based measurement of grain size and grain size distribution in a thin aluminum film
X Liu, AP Warren, NT Nuhfer, AD Rollett, KR Coffey, K Barmak
Acta Materialia 79, 138-145, 2014
152014
Linear bolometer array using a high TCR VOx-Au film
EM Smith, JC Ginn, AP Warren, CJ Long, D Panjwani, RE Peale, ...
Infrared Technology and Applications XL 9070, 90701Z, 2014
152014
Photoluminescence from RF sputtered SiCBN thin films
A Vijayakumar, AP Warren, RM Todi, KB Sundaram
Journal of Materials Science: Materials in Electronics 20 (2), 144-148, 2009
152009
Grain size dependence of the twin length fraction in nanocrystalline Cu thin films via transmission electron microscopy based orientation mapping
X Liu, NT Nuhfer, AP Warren, KR Coffey, GS Rohrer, K Barmak
Journal of Materials Research 30 (4), 528-537, 2015
132015
On twin density and resistivity of nanometric Cu thin films
K Barmak, X Liu, A Darbal, NT Nuhfer, D Choi, T Sun, AP Warren, ...
Journal of Applied Physics 120 (6), 065106, 2016
122016
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