Johnson Kwame Efavi
Johnson Kwame Efavi
Senior Lecturer University of Ghana
Verified email at ug.edu.gh
Title
Cited by
Cited by
Year
0.86-nm CET Gate Stacks With EpitaxialHigh-Dielectrics and FUSI NiSi Metal Electrodes
HDB Gottlob, T Echtermeyer, M Schmidt, T Mollenhauer, JK Efavi, ...
IEEE electron device letters 27 (10), 814-816, 2006
552006
CMOS integration of epitaxial Gd2O3 high-k gate dielectrics
HDB Gottlob, T Echtermeyer, T Mollenhauer, JK Efavi, M Schmidt, ...
Solid-State Electronics 50 (6), 979-985, 2006
522006
Highly selective HBr etch process for fabrication of Triple-Gate nano-scale SOI-MOSFETs
MC Lemme, T Mollenhauer, H Gottlob, W Henschel, J Efavi, C Welch, ...
Microelectronic engineering 73, 346-350, 2004
462004
Nanoscale TiN metal gate technology for CMOS integration
MC Lemme, JK Efavi, T Mollenhauer, M Schmidt, HDB Gottlob, ...
Microelectronic Engineering 83 (4-9), 1551-1554, 2006
412006
Highly selective etch process for silicon-on-insulator nano-devices
T Wahlbrink, T Mollenhauer, YM Georgiev, W Henschel, JK Efavi, ...
Microelectronic Engineering 78, 212-217, 2005
382005
Modified halloysite nanoclay as a vehicle for sustained drug delivery
EG Bediako, E Nyankson, D Dodoo-Arhin, B Agyei-Tuffour, D Łukowiec, ...
Heliyon 4 (7), e00689, 2018
312018
Introduction of crystalline high-k gate dielectrics in a CMOS process
HDB Gottlob, MC Lemme, T Mollenhauer, T Wahlbrink, JK Efavi, H Kurz, ...
Journal of non-crystalline solids 351 (21-23), 1885-1889, 2005
302005
Stress Analysis of standard Truck Chassis during ramping on Block using Finite Element Method”
HK Asker, TS Dawood, AF Said
ARPN Journal of Engineering and Applied Sciences 7 (6), 641-648, 2012
292012
Ghana’s Quest for Oil and Gas: Ecological Risks and Management Frameworks
RA P.A. Sakyi, J.K. Efavi, d. atta-Peters
West African Journal of Applied Ecology 20 (1), 57-70, 2012
272012
Development of porous ceramic bodies from kaolin deposits for industrial applications
JK Efavi, L Damoah, DY Bensah, DD Arhin, D Tetteh
Applied clay science 65, 31-36, 2012
252012
Subthreshold characteristics of p-type triple-gate MOSFETs
M Lemme, T Mollenhauer, W Henschel, T Wahlbrink, H Gottlob, J Efavi, ...
ESSDERC'03. 33rd Conference on European Solid-State Device Research, 2003á…, 2003
212003
The effect of NaOH catalyst concentration and extraction time on the yield and properties of Citrullus vulgaris seed oil as a potential biodiesel feed stock
JK Efavi, D Dodoo-Arhin, D Kanbogtah, V Apalangya, E Nyankson, ...
South African Journal of Chemical Engineering 25 (1), 98-102, 2018
192018
Investigation of MOS capacitors and SOI–MOSFETs with epitaxial gadolinium oxide (Gd2O3) and titanium nitride (TiN) electrodes
T Echtermeyer, HDB Gottlob, T Wahlbrink, T Mollenhauer, M Schmidt, ...
Solid-State Electronics 51 (4), 617-621, 2007
192007
Tungsten work function engineering for dual metal gate nano-CMOS
JK Efavi, T Mollenhauer, T Wahlbrink, HDB Gottlob, MC Lemme, H Kurz
Journal of Materials Science: Materials in Electronics 16 (7), 433-436, 2005
192005
Nanowire fin field effect transistors via UV-based nanoimprint lithography
A Fuchs, M Bender, U Plachetka, L Kock, T Wahlbrink, HDB Gottlob, ...
Journal of Vacuum Science & Technology B: Microelectronics and Nanometerá…, 2006
162006
Synthesis and characterisation of zeolite-A and Zn-exchanged zeolite-A based on natural aluminosilicates and their potential applications
E Nyankson, JK Efavi, A Yaya, G Manu, K Asare, J Daafuor, RY Abrokwah
Cogent Engineering 5 (1), 1440480, 2018
152018
Characterisation and identification of local kaolin clay from Ghana: A potential material for electroporcelain insulator fabrication
A Yaya, EK Tiburu, ME Vickers, JK Efavi, B Onwona-Agyeman, ...
Applied Clay Science 150, 125-130, 2017
132017
Formation of chitosan nanoparticles using deacetylated chitin isolated from freshwater algae and locally synthesized zeolite A and their influence on cancer cell growth
EK Tiburu, A Salifu, EO Aidoo, HNA Fleischer, G Manu, A Yaya, H Zhou, ...
Journal of Nano Research 48, 156-170, 2017
132017
Scalable gate first process for silicon on insulator metal oxide semiconductor field effect transistors with epitaxial high- dielectrics
HDB Gottlob, T Mollenhauer, T Wahlbrink, M Schmidt, T Echtermeyer, ...
Journal of Vacuum Science & Technology B: Microelectronics and Nanometerá…, 2006
132006
Impact of Al-, Ni-, TiN-, and Mo-metal gates on MOCVD-grown HfO2 and ZrO2 high-κ dielectrics
S Abermann, J Efavi, G Sj÷blom, M Lemme, J Olsson, E Bertagnolli
Microelectronics reliability 47 (4-5), 536-539, 2007
112007
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