| Transfer learning for object detection using state-of-the-art deep neural networks J Talukdar, S Gupta, PS Rajpura, RS Hegde 2018 5th international conference on signal processing and integrated …, 2018 | 80 | 2018 |
| Data augmentation on synthetic images for transfer learning using deep CNNs J Talukdar, A Biswas, S Gupta 2018 5th International Conference on Signal Processing and Integrated …, 2018 | 25 | 2018 |
| Functional criticality classification of structural faults in AI accelerators A Chaudhuri, J Talukdar, F Su, K Chakrabarty 2020 IEEE International Test Conference (ITC), 1-5, 2020 | 19 | 2020 |
| Transfer learning by finetuning pretrained CNNs entirely with synthetic images P Rajpura, A Aggarwal, M Goyal, S Gupta, J Talukdar, H Bojinov, ... National Conference on Computer Vision, Pattern Recognition, Image …, 2017 | 19 | 2017 |
| Human action recognition system using good features and multilayer perceptron network J Talukdar, B Mehta 2017 International Conference on Communication and Signal Processing (ICCSP …, 2017 | 17 | 2017 |
| Efficient fault-criticality analysis for ai accelerators using a neural twin A Chaudhuri, CY Chen, J Talukdar, S Madala, AK Dubey, K Chakrabarty 2021 IEEE International Test Conference (ITC), 73-82, 2021 | 12 | 2021 |
| High speed SRT divider for intelligent embedded system B Mehta, J Talukdar, S Gajjar 2017 International Conference on Soft Computing and Its Engineering …, 2017 | 11 | 2017 |
| Implementation of SNR estimation based energy detection on USRP and GNU radio for cognitive radio networks J Talukdar, B Mehta, K Aggrawal, M Kamani 2017 International Conference on Wireless Communications, Signal Processing …, 2017 | 11 | 2017 |
| Fault-criticality assessment for AI accelerators using graph convolutional networks A Chaudhuri, J Talukdar, J Jung, GJ Nam, K Chakrabarty 2021 Design, Automation & Test in Europe Conference & Exhibition (DATE …, 2021 | 9 | 2021 |
| Functional criticality analysis of structural faults in AI accelerators A Chaudhuri, J Talukdar, F Su, K Chakrabarty IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2022 | 7 | 2022 |
| Special session: Fault criticality assessment in ai accelerators A Chaudhuri, J Talukdar, K Chakrabarty 2022 IEEE 40th VLSI Test Symposium (VTS), 1-4, 2022 | 4 | 2022 |
| Automatic structural test generation for analog circuits using neural twins J Talukdar, A Chaudhuri, M Bhattacharya, K Chakrabarty 2022 IEEE International Test Conference (ITC), 145-154, 2022 | 3 | 2022 |
| Towards functionally robust AI accelerators S Banerjee, CY Chen, J Talukdar, SC Hung, A Chaudhuri, M Nikdast, ... 2021 IEEE Microelectronics Design & Test Symposium (MDTS), 1-6, 2021 | 3 | 2021 |
| Probabilistic fault grading for AI accelerators using neural twins A Chaudhuri, J Talukdar, K Chakrabarty 2022 IEEE Computer Society Annual Symposium on VLSI (ISVLSI), 333-338, 2022 | 2 | 2022 |
| TaintLock: Preventing IP theft through lightweight dynamic scan encryption using taint bits J Talukdar, A Chaudhuri, K Chakrabarty 2022 IEEE European Test Symposium (ETS), 1-6, 2022 | 2 | 2022 |
| A BIST-based dynamic Obfuscation scheme for resilience against removal and Oracle-guided attacks J Talukdar, S Chen, A Das, S Aftabjahani, P Song, K Chakrabarty 2021 IEEE International Test Conference (ITC), 170-179, 2021 | 2 | 2021 |
| Implementation of snr estimation based energy detection on usrp and gnu radio for cognitive radio networks B Mehta, J Talukdar, K Aggrawal, M Kamani arXiv preprint arXiv 1708, 2017 | 2 | 2017 |
| Transfer Learning for Object Detection using State-ofthe-Art Deep Neural Networks J Talukdar, S Gupta, PS Rajpura, RS Hegde Proceeding of the 5th International Conference on Signal Processing and …, 0 | 2 | |
| Simply-track-and-refresh: Efficient and scalable rowhammer mitigation E Ortega, T Bletsch, B Joardar, J Talukdar, W Paik, K Chakrabarty 2023 IEEE International Test Conference (ITC), 340-349, 2023 | 1 | 2023 |
| Securing Heterogeneous 2.5 D ICs Against IP Theft through Dynamic Interposer Obfuscation J Talukdar, A Chaudhuri, J Kim, SK Lim, K Chakrabarty 2023 Design, Automation & Test in Europe Conference & Exhibition (DATE), 1-2, 2023 | 1 | 2023 |
Krishnendu ChakrabartyFulton Professor of Microelectronics, School of Electrical and Computer and Energy EngineeringVerified email at asu.edu
