| Encryption of pictures and shapes by random grids O Kafri, E Keren Optics letters 12 (6), 377-379, 1987 | 440 | 1987 |
| The physics of moiré metrology O Kafri, I Glatt Wiley, 1990 | 346 | 1990 |
| Noncoherent method for mapping phase objects O Kafri Optics letters 5 (12), 555-557, 1980 | 237 | 1980 |
| Measurements of temperature distribution of flames by moiré deflectometry E Keren, E Bar-Ziv, I Glatt, O Kafri Applied Optics 20 (24), 4263-4266, 1981 | 193 | 1981 |
| Moiré deflectometry: a ray deflection approach to optical testing O Kafri, I Glatt Optical Engineering 24 (6), 944-960, 1985 | 148 | 1985 |
| Method and apparatus of encryption of optical images O Kafri, E Keren US Patent 4,776,013, 1988 | 142 | 1988 |
| Diffraction effects in moiré deflectometry E Keren, O Kafri JOSA A 2 (2), 111-120, 1985 | 136 | 1985 |
| Finite time thermodynamics: Optimal expansion of a heated working fluid YB Band, O Kafri, P Salamon Journal of Applied Physics 53 (1), 8-28, 1982 | 107 | 1982 |
| Maximum power from a cycling working fluid P Salamon, YB Band, O Kafri Journal of Applied Physics 53 (1), 197-202, 1982 | 94 | 1982 |
| Optimization of a model internal combustion engine BM Aizenbud, YB Band, O Kafri Journal of Applied Physics 53 (3), 1277-1282, 1982 | 85 | 1982 |
| File encryption method O Kafri US Patent 5,751,814, 1998 | 78 | 1998 |
| Universal method for determining the focal length of optical systems by moiré deflectometry E Keren, KM Kreske, O Kafri Applied optics 27 (8), 1383-1385, 1988 | 76 | 1988 |
| Determination of the focal length of nonparaxial lenses by moire deflectometry I Glatt, O Kafri Applied optics 26 (13), 2507-2508, 1987 | 72 | 1987 |
| A new method for density gradient measurements in compressible flows J Stricker, O Kafri AIAA Journal 20 (6), 820-823, 1982 | 72 | 1982 |
| Temperature mapping in flames by moiré deflectometry E Bar-Ziv, S Sgulim, O Kafri, E Keren Applied Optics 22 (5), 698-705, 1983 | 69 | 1983 |
| Refractive-index measurements by moire deflectometry Z Karny, O Kafri Applied Optics 21 (18), 3326-3328, 1982 | 68 | 1982 |
| Reflective surface analysis using moiré deflectometry O Kafri, A Livnat Applied Optics 20 (18), 3098-3100, 1981 | 66 | 1981 |
| Moiré deflectometry—ray tracing interferometry I Glatt, O Kafri Optics and lasers in engineering 8 (3-4), 277-320, 1988 | 57 | 1988 |
| Axisymmetric density field measurements by moiré deflectometry J Stricker, E Keren, O Kafri AIAA Journal 21 (12), 1767-1769, 1983 | 55 | 1983 |
| Method and equipment for mapping radiation deflection O Kafri, A Livnat US Patent 4,459,027, 1984 | 51 | 1984 |
Peter SalamonProfessor of Mathematics, San Diego State UniversityVerified email at sdsu.edu
