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Luis Felipe Lastras Martinez
Luis Felipe Lastras Martinez
University of San Luis Potosi
Verified email at cactus.iico.uaslp.mx - Homepage
Title
Cited by
Cited by
Year
Model for the linear electro-optic reflectance-difference spectrum of GaAs(001) around and
A Lastras-Martínez, RE Balderas-Navarro, LF Lastras-Martínez, MA Vidal
Physical Review B 59 (15), 10234, 1999
701999
Model for the linear electro-optic reflectance-difference spectrum of GaAs(001) around and
A Lastras-Martínez, RE Balderas-Navarro, LF Lastras-Martínez, MA Vidal
Physical Review B 59 (15), 10234, 1999
701999
Reflectance anisotropy of GaAs (100): Dislocation-induced piezo-optic effects
LF Lastras-Martínez, A Lastras-Martínez
Physical Review B 54 (15), 10726, 1996
511996
Reflectance anisotropy of GaAs (100): Dislocation-induced piezo-optic effects
LF Lastras-Martínez, A Lastras-Martínez
Physical Review B 54 (15), 10726, 1996
511996
GaAs (001): Surface structure and optical properties
WG Schmidt, F Bechstedt, K Fleischer, C Cobet, N Esser, W Richter, ...
Physica status solidi (a) 188 (4), 1401-1409, 2001
402001
Surface-stress-induced optical bulk anisotropy
K Hingerl, RE Balderas-Navarro, W Hilber, A Bonanni, D Stifter
Physical Review B 62 (19), 13048, 2000
352000
Optical anisotropy of (001)-GaAs surface quantum wells
LF Lastras-Martinez, D Rönnow, PV Santos, M Cardona, K Eberl
Physical Review B 64 (24), 245303, 2001
342001
Optical anisotropy of (001)-GaAs surface quantum wells
LF Lastras-Martinez, D Rönnow, PV Santos, M Cardona, K Eberl
Physical Review B 64 (24), 245303, 2001
342001
A spectrometer for the measurement of reflectance‐difference spectra
LF Lastras‐Martínez, A Lastras‐Martínez, RE Balderas‐Navarro
Review of scientific instruments 64 (8), 2147-2152, 1993
341993
The Physics of Semiconductors
VY Prinz, VA Seleznev, AK Gutakovsky
World Sci 7, 351, 1999
331999
Stress-induced optical anisotropies measured by modulated reflectance
LF Lastras-Martínez, RE Balderas-Navarro, A Lastras-Martínez, K Hingerl
Semiconductor science and technology 19 (9), R35, 2004
292004
Comment on “Ab Initio Calculation of Excitonic Effects in the Optical Spectra of Semiconductors”
M Cardona, LF Lastras-Martinez, DE Aspnes
Physical review letters 83 (19), 3970, 1999
291999
Effect of reconstruction-induced strain on the reflectance difference spectroscopy of GaAs (001) around and transitions
LF Lastras-Martínez, JM Flores-Camacho, RE Balderas-Navarro, ...
Physical Review B 75 (23), 235315, 2007
232007
A rotating-compensator based reflectance difference spectrometer for fast spectroscopic measurements
CG Hu, LD Sun, JM Flores-Camacho, M Hohage, CY Liu, XT Hu, ...
Review of Scientific Instruments 81 (4), 2010
222010
Photoreflectance spectroscopy of CdTe(001) around and linear electro-optic spectrum
A Lastras-Martınez, RE Balderas-Navarro, P Cantú-Alejandro, ...
Journal of applied physics 86 (4), 2062-2065, 1999
211999
Determination of the piezo-optical properties of semiconductors above the fundamental gap by means of reflectance difference spectroscopy
D Rönnow, LF Lastras-Martınez, M Cardona, PV Santos
JOSA A 16 (3), 568-573, 1999
211999
Isotope effects on the electronic critical points of germanium: Ellipsometric investigation of the and transitions
D Rönnow, LF Lastras-Martínez, M Cardona
The European Physical Journal B-Condensed Matter and Complex Systems 5 (1 …, 1998
211998
Microreflectance difference spectrometer based on a charge coupled device camera: surface distribution of polishing-related linear defect density in GaAs (001)
LF Lastras-Martínez, R Castro-García, RE Balderas-Navarro, ...
Applied Optics 48 (30), 5713-5717, 2009
202009
Measurement of the surface strain induced by reconstructed surfaces of GaAs (001) using photoreflectance and reflectance-difference spectroscopies
LF Lastras-Martínez, JM Flores-Camacho, A Lastras-Martínez, ...
Physical review letters 96 (4), 047402, 2006
202006
Reflectance difference spectroscopy of under a uniaxial stress
LF Lastras-Martínez, M Chavira-Rodríguez, RE Balderas-Navarro, ...
Physical Review B 70 (3), 035306, 2004
202004
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