| Photoluminescence properties of silicon nanocrystals as a function of their size G Ledoux, O Guillois, D Porterat, C Reynaud, F Huisken, B Kohn, ... Physical Review B 62 (23), 15942, 2000 | 639 | 2000 |
| Improved one-phonon confinement model for an accurate size determination of silicon nanocrystals V Paillard, P Puech, MA Laguna, R Carles, B Kohn, F Huisken Journal of Applied Physics 86 (4), 1921-1924, 1999 | 342 | 1999 |
| From free clusters to cluster-assembled materials P Melinon, V Paillard, V Dupuis, A Perez, P Jensen, A Hoareau, JP Perez, ... International journal of modern physics B 9 (04n05), 339-397, 1995 | 328 | 1995 |
| Deposition of SiO2 and TiO2 thin films by plasma enhanced chemical vapor deposition for antireflection coating C Martinet, V Paillard, A Gagnaire, J Joseph Journal of Non-Crystalline Solids 216, 77-82, 1997 | 237 | 1997 |
| Photoluminescence and resonant Raman spectra of silicon films produced by size-selected cluster beam deposition M Ehbrecht, B Kohn, F Huisken, MA Laguna, V Paillard Physical Review B 56 (11), 6958, 1997 | 232 | 1997 |
| Engineering strained silicon on insulator wafers with the Smart CutTM technology B Ghyselen, JM Hartmann, T Ernst, C Aulnette, B Osternaud, ... Solid-state electronics 48 (8), 1285-1296, 2004 | 165 | 2004 |
| Diamondlike carbon films obtained by low energy cluster beam deposition: evidence of a memory effect of the properties of free carbon clusters V Paillard, P Melinon, V Dupuis, JP Perez, A Perez, B Champagnon Physical review letters 71 (25), 4170, 1993 | 157 | 1993 |
| Evolutionary multi-objective optimization of colour pixels based on dielectric nanoantennas PR Wiecha, A Arbouet, C Girard, A Lecestre, G Larrieu, V Paillard Nature nanotechnology 12 (2), 163-169, 2017 | 143 | 2017 |
| Stress measurements of germanium nanocrystals embedded in silicon oxide A Wellner, V Paillard, C Bonafos, H Coffin, A Claverie, B Schmidt, ... Journal of Applied Physics 94 (9), 5639-5642, 2003 | 140 | 2003 |
| Silicon as a candidate carrier for ERE G Ledoux, M Ehbrecht, O Guillois, F Huisken, B Kohn, M Laguna, ... Astronomy and Astrophysics-A&A 333, 39-42, 1998 | 120 | 1998 |
| Damping of the acoustic vibrations of individual gold nanoparticles R Marty, A Arbouet, C Girard, A Mlayah, V Paillard, VK Lin, SL Teo, ... Nano letters 11 (8), 3301-3306, 2011 | 100 | 2011 |
| Structured films of light-emitting silicon nanoparticles produced by cluster beam deposition F Huisken, B Kohn, V Paillard Applied physics letters 74 (25), 3776-3778, 1999 | 87 | 1999 |
| Resonant Raman scattering in polycrystalline silicon thin films V Paillard, P Puech, MA Laguna, P Temple-Boyer, B Caussat, JP Couderc, ... Applied physics letters 73 (12), 1718-1720, 1998 | 86 | 1998 |
| Strongly directional scattering from dielectric nanowires PR Wiecha, A Cuche, A Arbouet, C Girard, G Colas des Francs, ... ACS photonics 4 (8), 2036-2046, 2017 | 83 | 2017 |
| Experimental study of LO phonons and excitons in ZnO nanoparticles produced by room-temperature organometallic synthesis F Demangeot, V Paillard, PM Chassaing, ML Kahn, A Maisonnat, ... Applied physics letters 88 (7), 2006 | 78 | 2006 |
| Production of diamondlike carbon films through random compact cluster stacking V Paillard, P Melinon, V Dupuis, A Perez, JP Perez, G Guiraud, ... Physical Review B 49 (16), 11433, 1994 | 71 | 1994 |
| Surface optical phonons as a probe of organic ligands on ZnO nanoparticles: An investigation using a dielectric continuum model and Raman spectrometry PM Chassaing, F Demangeot, V Paillard, A Zwick, N Combe, C Pages, ... Physical Review B—Condensed Matter and Materials Physics 77 (15), 153306, 2008 | 70 | 2008 |
| Magnetic properties of nanostructured iron films obtained by low energy neutral cluster beam deposition JP Perez, V Dupuis, J Tuaillon, A Perez, V Paillard, P Melinon, M Treilleux, ... Journal of magnetism and magnetic materials 145 (1-2), 74-80, 1995 | 69 | 1995 |
| Observations of confined acoustic phonons in silicon membranes CMS Torres, A Zwick, F Poinsotte, J Groenen, M Prunnila, J Ahopelto, ... physica status solidi (c) 1 (11), 2609-2612, 2004 | 67 | 2004 |
| Measurement of the in-depth stress profile in hydrogenated microcrystalline silicon thin films using Raman spectrometry V Paillard, P Puech, R Sirvin, S Hamma, P Roca i Cabarrocas Journal of Applied Physics 90 (7), 3276-3279, 2001 | 67 | 2001 |
Arnaud ArbouetCEMES-CNRS, Centre d'Elaboration de Matériaux et d'Etudes StructuralesVerified email at cnrs.fr
