עקוב אחר
Jean-Pierre Raskin
Jean-Pierre Raskin
Université catholique de Louvain, Engineering School of Louvain
כתובת אימייל מאומתת בדומיין uclouvain.be
כותרת
צוטט על ידי
צוטט על ידי
שנה
Substrate crosstalk reduction using SOI technology‏
JP Raskin, A Viviani, D Flandre, JP Colinge‏
IEEE Transactions on electron devices 44 (12), 2252-2261, 1997‏
4071997
New substrate passivation method dedicated to HR SOI wafer fabrication with increased substrate resistivity‏
D Lederer, JP Raskin‏
IEEE Electron Device Letters 26 (11), 805-807, 2005‏
2902005
Low temperature implementation of dopant-segregated band-edge metallic S/D junctions in thin-body SOI p-MOSFETs‏
G Larrieu, E Dubois, R Valentin, N Breil, F Danneville, G Dambrine, ...‏
2007 IEEE International Electron Devices Meeting, 147-150, 2007‏
2792007
Arsenic-segregated rare-earth silicide junctions: reduction of Schottky barrier and integration in metallic n-MOSFETs on SOI‏
G Larrieu, DA Yarekha, E Dubois, N Breil, O Faynot‏
IEEE Electron Device Letters 30 (12), 1266-1268, 2009‏
2672009
Raman and XPS characterization of vanadium oxide thin films with temperature‏
F Ureña-Begara, A Crunteanu, JP Raskin‏
Applied Surface Science 403, 717-727, 2017‏
2662017
Influence of device engineering on the analog and RF performances of SOI MOSFETs‏
V Kilchytska, A Neve, L Vancaillie, D Levacq, S Adriaensen, H van Meer, ...‏
IEEE Transactions on Electron Devices 50 (3), 577-588, 2003‏
2662003
Fabrication method of so1 semiconductor devices‏
D Fladre, A De Mevergnies, JP Raskins‏
US Patent App. 10/471,847, 2004‏
2532004
Identification of RF harmonic distortion on Si substrates and its reduction using a trap-rich layer‏
DC Kerr, JM Gering, TG McKay, MS Carroll, CR Neve, JP Raskin‏
2008 IEEE Topical Meeting on Silicon Monolithic Integrated Circuits in RF …, 2008‏
1842008
Fully-depleted SOI CMOS for analog applications‏
JP Colinge‏
IEEE Transactions on Electron Devices 45 (5), 1010-1016, 1998‏
1751998
Semiconductor-on-insulator materials for nanoelectronics applications‏
A Nazarov, JP Colinge, F Balestra, JP Raskin, F Gamiz, VS Lysenko‏
Springer Berlin Heidelberg, 2011‏
1682011
A 94-GHz aperture-coupled micromachined microstrip antenna‏
GP Gauthier, JP Raskin, LPB Katehi, GM Rebeiz‏
IEEE Transactions on Antennas and Propagation 47 (12), 1761-1766, 1999‏
1681999
Substrate loss mechanisms for microstrip and CPW transmission lines on lossy silicon wafers‏
D Lederer, JP Raskin‏
Solid-State Electronics 47 (11), 1927-1936, 2003‏
1642003
Low-temperature wafer bonding: a study of void formation and influence on bonding strength‏
XX Zhang, JP Raskin‏
Journal of microelectromechanical systems 14 (2), 368-382, 2005‏
1582005
Inter-and intragranular plasticity mechanisms in ultrafine-grained Al thin films: An in situ TEM study‏
F Mompiou, M Legros, A Boé, M Coulombier, JP Raskin, T Pardoen‏
Acta materialia 61 (1), 205-216, 2013‏
1482013
Accurate SOI MOSFET characterization at microwave frequencies for device performance optimization and analog modeling‏
JP Raskin, R Gillon, J Chen, D Vanhoenacker-Janvier, JP Colinge‏
IEEE Transactions on Electron Devices 45 (5), 1017-1025, 1998‏
1481998
Junctionless transistors: physics and properties‏
JP Colinge, CW Lee, N Dehdashti Akhavan, R Yan, I Ferain, P Razavi, ...‏
Semiconductor-on-insulator materials for nanoelectronics applications, 187-200, 2011‏
1462011
Micromachined thin-film sensors for SOI-CMOS co-integration‏
J Laconte, D Flandre, JP Raskin‏
Springer Science & Business Media, 2006‏
1462006
Comparison of TiSi2, CoSi2, and NiSi for thin‐film silicon‐on‐insulator applications‏
J Chen, JP Colinge, D Flandre, R Gillon, JP Raskin, D Vanhoenacker‏
Journal of the Electrochemical Society 144 (7), 2437, 1997‏
1421997
Analog/RF performance of multiple gate SOI devices: wideband simulations and characterization‏
JP Raskin, TM Chung, V Kilchytska, D Lederer, D Flandre‏
IEEE Transactions on Electron Devices 53 (5), 1088-1095, 2006‏
1372006
New on-chip nanomechanical testing laboratory-applications to aluminum and polysilicon thin films‏
S Gravier, M Coulombier, A Safi, N André, A Boé, JP Raskin, T Pardoen‏
Journal of microelectromechanical systems 18 (3), 555-569, 2009‏
1322009
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מאמרים 1–20