| A DAG-based algorithm for obstacle-aware topology-matching on-track bus routing CH Hsu, SC Hung, H Chen, FK Sun, YW Chang Proceedings of the 56th Annual Design Automation Conference 2019, 1-6, 2019 | 17 | 2019 |
| Power supply noise-aware scan test pattern reshaping for at-speed delay fault testing of monolithic 3D ICs SC Hung, YC Lu, SK Lim, K Chakrabarty 2020 IEEE 29th Asian Test Symposium (ATS), 1-6, 2020 | 7 | 2020 |
| Graph neural network-based delay-fault localization for monolithic 3D ICs SC Hung, S Banerjee, A Chaudhuri, K Chakrabarty 2022 Design, Automation & Test in Europe Conference & Exhibition (DATE), 448-453, 2022 | 5 | 2022 |
| Towards Functionally Robust AI Accelerators S Banerjee, CY Chen, J Talukdar, SC Hung, A Chaudhuri, M Nikdast, ... 2021 IEEE Microelectronics Design & Test Symposium (MDTS), 1-6, 2021 | 4 | 2021 |
| Disjoint-support decomposition and extraction for interconnect-driven threshold logic synthesis H Chen, SC Hung, JHR Jiang Proceedings of the 56th Annual Design Automation Conference 2019, 1-6, 2019 | 4 | 2019 |
| Power Supply Noise-Aware At-Speed Delay Fault Testing of Monolithic 3-D ICs SC Hung, YC Lu, SK Lim, K Chakrabarty IEEE Transactions on Very Large Scale Integration (VLSI) Systems 29 (11 …, 2021 | 3 | 2021 |
| Advances in Testing and Design-for-Test Solutions for M3D Integrated Circuits S Banerjee, A Chaudhuri, SC Hung, K Chakrabarty 2021 Design, Automation & Test in Europe Conference & Exhibition (DATE), 152-157, 2021 | 2 | 2021 |
| Design of a reliable power delivery network for monolithic 3D ICs SC Hung, K Chakrabarty 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE …, 2020 | 2 | 2020 |
| Observation Point Insertion Using Deep Learning B Bhaskaran, S Banerjee, K Narayanun, SC Hung, SNM Mojaveri, M Liu, ... Proceedings of the 41st IEEE/ACM International Conference on Computer-Aided …, 2022 | 1 | 2022 |
| Fault Diagnosis for Resistive Random-Access Memory and Monolithic Inter-tier Vias in Monolithic 3D Integration SC Hung, A Chaudhuri, S Banerjee, K Chakrabarty 2022 IEEE International Test Conference (ITC), 118-127, 2022 | 1 | 2022 |
| Scan Cell Segmentation Based on Reinforcement Learning for Power-Safe Testing of Monolithic 3D ICs SC Hung, A Chaudhuri, S Banerjee, K Chakrabarty 2023 IEEE International Test Conference (ITC), 216-225, 2023 | | 2023 |
| Test-Point Insertion for Power-Safe Testing of Monolithic 3D ICs using Reinforcement Learning* SC Hung, A Chaudhuri, K Chakrabarty 2023 IEEE European Test Symposium (ETS), 1-6, 2023 | | 2023 |
| Transferable Graph Neural Network-based Delay-Fault Localization for Monolithic 3D ICs SC Hung, S Banerjee, A Chaudhuri, J Kim, SK Lim, K Chakrabarty IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2023 | | 2023 |
| Special Session: Using Graph Neural Networks for Tier-Level Fault Localization in Monolithic 3D ICs * SC Hung, A Chaudhuri, S Banerjee, K Chakrabarty 2023 IEEE 41st VLSI Test Symposium (VTS), 1-4, 2023 | | 2023 |
