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Co-authors
- Xiaoliang Zeng (曾小亮)Shenzhen Institutes of Advanced Technology, Chinese Academy of SciencesVerified email at siat.ac.cn
- Rong SunShenzhen Institutes of Advanced Technology, Chinese Academy of SciencesVerified email at siat.ac.cn
- zefeng chenSCNU, CUHKVerified email at ee.cuhk.edu.hk
- Yimin Yao (么依民)PhD, Associate Researcher, SIEM, SIAT, CASVerified email at siat.ac.cn
- Xie WeiguangJinan UniversityVerified email at email.jnu.edu.cn
- Mingzhu LongSCNU, CUHKVerified email at m.scnu.edu.cn
- Li TaoSchool of Physics, Beijing Institute of TechnologyVerified email at link.cuhk.edu.hk
- Yan, KeyouSouth China University of Technology;CUHK; HKUSTVerified email at scut.edu.cn
- Xiaomu WangSchool of Electronic Science and Engineering, Nanjing UniversityVerified email at nju.edu.cn
- qian miaoThe Chinese University of Hong KongVerified email at cuhk.edu.hk
- Xi WANDept. of Electronic Engineering, Jiangnan UniversityVerified email at jiangnan.edu.cn
- Tiankai ZhangLinkoping UniversityVerified email at liu.se
- Kun CHENSun Yat-sen UniversityVerified email at mail.sysu.edu.cn
- Hon Ki TsangDean, Faculty of Engineering, The Chinese University of Hong KongVerified email at ee.cuhk.edu.hk
- ni zhaoThe Chinese University of Hong KongVerified email at ee.cuhk.edu.hk
- Xinhui Luthe Chinese University of Hong KongVerified email at phy.cuhk.edu.hk
- Minchao QINThe Chinese University of Hong KongVerified email at link.cuhk.edu.hk
- Xinming LiTHU, MIT, NCNST, CUHK, PolyU, NIMS, South China Normal UniverstiyVerified email at m.scnu.edu.cn
- Xinran WangProfessor, Nanjing UniversityVerified email at nju.edu.cn
- Wangying XuPh.D, Department of Electronic Engineering, The Chinese University of Hong KongVerified email at ee.cuhk.edu.hk
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Jian-Bin XU (许建斌, J.B. XU)
Chinese University of Hong Kong (CUHK); Shenzhen Institute of Advanced Technology (SIAT), CAS
Verified email at ee.cuhk.edu.hk - Homepage