Michael Hassoun
Michael Hassoun
Verified email at ariel.ac.il
Title
Cited by
Cited by
Year
Cycle-time key factor identification and prediction in semiconductor manufacturing using machine learning and data mining
Y Meidan, B Lerner, G Rabinowitz, M Hassoun
IEEE transactions on semiconductor manufacturing 24 (2), 237-248, 2011
612011
Equilibria, stability, and transients in re-entrant lines under FBFS and LBFS dispatch and constant release
CB Yan, M Hassoun, SM Meerkov
IEEE Transactions on Semiconductor Manufacturing 25 (2), 211-229, 2012
142012
Setting defect charts control limits to balance cycle time and yield for a tandem production line
M Gilenson, M Hassoun, L Yedidsion
Computers & Operations Research 53, 301-308, 2015
132015
Identification and cost estimation of WIP bubbles in a fab
M Hassoun, G Rabinowitz, S Lachs
IEEE transactions on semiconductor manufacturing 21 (2), 217-223, 2008
122008
On improving the predictability of cycle time in an NVM fab by correct segmentation of the process
M Hassoun
IEEE transactions on semiconductor manufacturing 26 (4), 613-618, 2013
82013
A new high-volume/low-mix simulation testbed for semiconductor manufacturing
M Hassoun, D Kopp, L Mönch, A Kalir
2019 Winter Simulation Conference (WSC), 2419-2428, 2019
62019
Towards a new simulation testbed for semiconductor manufacturing
M Hassoun, A Kalir
2017 Winter Simulation Conference (WSC), 3612-3623, 2017
62017
Hunting down the bubble makers in fabs
M Hassoun, G Rabinowitz
IEEE transactions on semiconductor manufacturing 23 (1), 13-20, 2009
62009
Data mining for cycle time key factor identification and prediction in semiconductor manufacturing
Y Meidan, B Lerner, M Hassoun, G Rabinowitz
IFAC Proceedings Volumes 42 (4), 217-222, 2009
52009
SMT2020—A semiconductor manufacturing testbed
D Kopp, M Hassoun, A Kalir, L Mönch
IEEE Transactions on Semiconductor Manufacturing 33 (4), 522-531, 2020
42020
Allocating metrology capacity to multiple heterogeneous machines
S Dauzère-Pérès, M Hassoun, A Sendon
International Journal of Production Research 54 (20), 6082-6091, 2016
32016
Classification and cost estimation of WIP bubbles in a fab
M Hassoun, G Rabinowitz, S Lachs
ISSM 2005, IEEE International Symposium on Semiconductor Manufacturing, 2005 …, 2005
32005
The single line moving target traveling salesman problem with release times
M Hassoun, S Shoval, E Simchon, L Yedidsion
Annals of Operations Research, 1-10, 2019
22019
Optimizing capacity assignment of multiple identical metrology tools
S Dauzère-Pérès, M Hassoun, A Sendon
2016 Winter Simulation Conference (WSC), 2709-2718, 2016
22016
Setting quality control requirements to balance between cycle time and yield in a semiconductor production line
M Gilenson, M Hassoun, L Yedidsion
Proceedings of the Winter Simulation Conference 2014, 2422-2433, 2014
22014
Setting quality control requirements to balance cycle time and yield—The single machine case
M Gilenson, L Yedidsion, M Hassoun
Proceedings of the 2012 Winter Simulation Conference (WSC), 1-9, 2012
22012
Prediction of product layer cycle time using data mining
M Hassoun
2013 Winter Simulations Conference (WSC), 3905-3911, 2013
12013
Security agent allocation to partially observable heterogeneous frontier segments
M Hassoun, G Rabinowitz, N Reshef
IIE Transactions 43 (8), 566-574, 2011
12011
Attention Allocation to Partially Observable Heterogeneous Customers
M Hassoun, PG Rabinowitz
Ms. E. thesis, IE&M Dept. BGU, 0
1
Integrating Critical Queue Time Constraints Into SMT2020 Simulation Models
D Kopp, M Hassoun, A Kalir, L Mönch
2020 Winter Simulation Conference (WSC), 1813-1824, 2020
2020
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Articles 1–20