Ibrahim Abdulhalim
Ibrahim Abdulhalim
Professor of Electrooptic Engineering, Ben Gurion University
Verified email at bgu.ac.il
TitleCited byYear
Surface plasmon resonance for biosensing: a mini-review
I Abdulhalim, M Zourob, A Lakhtakia
Electromagnetics 28 (3), 214-242, 2008
3672008
Sensitivity‐enhancement methods for surface plasmon sensors
A Shalabney, I Abdulhalim
Laser & Photonics Reviews 5 (4), 571-606, 2011
2662011
Electromagnetic fields distribution in multilayer thin film structures and the origin of sensitivity enhancement in surface plasmon resonance sensors
A Shalabney, I Abdulhalim
Sensors and Actuators A: Physical 159 (1), 24-32, 2010
1922010
Spectroscopic scatterometer system
Y Xu, I Abdulhalim
US Patent 6,483,580, 2002
1892002
Spectroscopic scatterometer system
Y Xu, I Abdulhalim
US Patent 6,483,580, 2002
1802002
Spectroscopic scatterometer system
Y Xu, I Abdulhalim
US Patent 6,483,580, 2002
1802002
Sensitivity enhancement of guided-wave surface-plasmon resonance sensors
A Lahav, M Auslender, I Abdulhalim
Optics Letters 33 (21), 2539-2541, 2008
1652008
Spectroscopic scatterometer system
Y Xu, I Abdulhalim
US Patent 6,590,656, 2003
1422003
Omnidirectional reflection from Fibonacci quasi-periodic one-dimensional photonic crystal
D Lusk, I Abdulhalim, F Placido
Optics Communications 198 (4-6), 273-279, 2001
1412001
Methods and systems for determining a critical dimension and overlay of a specimen
A Levy, KA Brown, R Smedt, G Bultman, M Nikoonahad, D Wack, ...
US Patent 8,179,530, 2012
1302012
Analytic propagation matrix method for linear optics of arbitrary biaxial layered media
I Abdulhalim
Journal of Optics A: Pure and Applied Optics 1 (5), 646, 1999
1171999
Periodic patterns and technique to control misalignment
I Abdulhalim, M Adel, M Friedmann, M Faeyrman
US Patent App. 09/833,084, 2003
1122003
Figure-of-merit enhancement of surface plasmon resonance sensors in the spectral interrogation
A Shalabney, I Abdulhalim
Optics Letters 37 (7), 1175-1177, 2012
1112012
Methods and systems for determining a critical dimension and overlay of a specimen
A Levy, KA Brown, G Bultman, M Nikoonahad, D Wack, J Fielden
US Patent 6,891,627, 2005
962005
Methods and systems for determining a critical dimension and overlay of a specimen
A Levy, KA Brown, R Smedt, G Bultman, M Nikoonahad, D Wack, ...
US Patent 7,751,046, 2010
912010
Liquid crystal Lyot tunable filter with extended free spectral range
O Aharon, I Abdulhalim
Optics Express 17 (14), 11426-11433, 2009
862009
Selective reflection by helicoidal liquid crystals. results of an exact calculation using the 4 x 4 characteristic matrix method
I Abdulhalim, L Benguigui, R Weil
Journal de Physique 46 (5), 815-825, 1985
831985
Competence between spatial and temporal coherence in full field optical coherence tomography and interference microscopy
I Abdulhalim
Journal of Optics A: Pure and Applied Optics 8 (11), 952, 2006
742006
Electrically and optically controlled light modulation and color switching using helix distortion of ferroelectric liquid crystals
I Abdulhalim, G Moddel
Molecular Crystals and Liquid Crystals 200 (1), 79-101, 1991
741991
Two-Dimensional SiO2/VO2 Photonic Crystals with Statically Visible and Dynamically Infrared Modulated for Smart Window Deployment
Y Ke, I Balin, N Wang, Q Lu, AIY Tok, TJ White, S Magdassi, I Abdulhalim, ...
ACS applied materials & interfaces 8 (48), 33112-33120, 2016
722016
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