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Co-authors
- Koji Yamada, K. YamadaAIST, National Institute of Advanced Industrial Science and TechnologyVerified email at aist.go.jp
- Hidetaka NISHINTTVerified email at lab.ntt.co.jp
- Hiroki HibinoKwansei Gakuin UniversityVerified email at kwansei.ac.jp
- Nobuyuki MatsudaTohoku UniversityVerified email at tohoku.ac.jp
- Hideaki KimuraExective Research Engineer, NTT Network Service Systems LaboratoriesVerified email at lab.ntt.co.jp
- Chan-Shan Yang (楊承山)Associate Prof., Institute of Electro-Optical Engineering, National Taiwan Normal University (NTNU)Verified email at ntnu.edu.tw
- Sihan ZhaoDepartment of Physics, Zhejiang UniversityVerified email at zju.edu.cn
- M. Iqbal Bakti UtamaPostdoc, Northwestern U. | Past: LBNL, UC Berkeley, NTUsgVerified email at northwestern.edu
- Hans KleemannTechnical University DresdenVerified email at tu-dresden.de
- Steven G. LouieProfessor of Physics, University of California at BerkeleyVerified email at berkeley.edu
- Sheng WangWuhan UniversityVerified email at whu.edu.cn
- Jason HorngNational Institute of Standards and TechnologyVerified email at nist.gov
- Ji-Hun KangAssociate Professor, Department of Optical Engineering, Kongju National UniversityVerified email at kongju.ac.kr
- Yuan WangUniversity of California, BerkeleyVerified email at berkeley.edu
- Taiki HatakeyamaApplied Materials, Inc.Verified email at amat.com
- Yuya YonezuNTT Basic Research Laboratories, NTT CorporationVerified email at hco.ntt.co.jp
- Shinichiro MutohNTT ElectronicsVerified email at ntt-el.com
- Hiroyuki ShibataKitami Institute of TechnologyVerified email at mail.kitami-it.ac.jp