Robust system design with built-in soft-error resilience S Mitra, N Seifert, M Zhang, Q Shi, KS Kim Computer 38 (2), 43-52, 2005 | 794 | 2005 |
Sequential element design with built-in soft error resilience M Zhang, S Mitra, TM Mak, N Seifert, NJ Wang, Q Shi, KS Kim, ... IEEE Transactions on Very Large Scale Integration (VLSI) Systems 14 (12 …, 2006 | 283 | 2006 |
X-compact: An efficient response compaction technique S Mitra, KS Kim IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2004 | 267 | 2004 |
X-compact: An efficient response compaction technique for test cost reduction S Mitra, KS Kim Proceedings. International Test Conference, 311-320, 2002 | 258 | 2002 |
Combinational logic soft error correction S Mitra, M Zhang, S Waqas, N Seifert, B Gill, KS Kim 2006 IEEE International Test Conference, 1-9, 2006 | 205 | 2006 |
Delay defect characteristics and testing strategies KS Kim, S Mitra, PG Ryan IEEE Design & Test of Computers 20 (5), 8-16, 2003 | 135 | 2003 |
XPAND: An efficient test stimulus compression technique S Mitra, KS Kim IEEE Transactions on Computers 55 (2), 163-173, 2006 | 112 | 2006 |
Scan-based built-in self test (BIST) with automatic reseeding of pattern generator KS Kim US Patent 5,574,733, 1996 | 110 | 1996 |
Built-in soft error resilience for robust system design S Mitra, M Zhang, N Seifert, TM Mak, KS Kim 2007 IEEE International Conference on Integrated Circuit Design and …, 2007 | 105 | 2007 |
Observing the Sun with the Atacama Large Millimeter/submillimeter Array (ALMA): Fast-scan single-dish mapping SM White, K Iwai, NM Phillips, RE Hills, A Hirota, P Yagoubov, G Siringo, ... Solar Physics 292, 1-28, 2017 | 101 | 2017 |
Soft error resilient system design through error correction S Mitra, M Zhang, N Seifert, TM Mak, KS Kim VLSI-SoC: Research Trends in VLSI and Systems on Chip: Fourteenth …, 2008 | 98 | 2008 |
Observing the sun with the Atacama large millimeter/submillimeter array (ALMA): high-resolution interferometric imaging M Shimojo, TS Bastian, AS Hales, SM White, K Iwai, RE Hills, A Hirota, ... Solar Physics 292, 1-28, 2017 | 71 | 2017 |
Partial scan by use of empirical testability KS Kim, CR Kime 1990 IEEE International Conference on Computer-Aided Design, 314,315,316,317 …, 1990 | 60 | 1990 |
Comparison of damped oscillations in solar and stellar X-ray flares IH Cho, KS Cho, VM Nakariakov, S Kim, P Kumar The Astrophysical Journal 830 (2), 110, 2016 | 56 | 2016 |
XMAX: X-tolerant architecture for MAXimal test compression S Mitra, KS Kim Proceedings 21st International Conference on Computer Design, 326-330, 2003 | 56 | 2003 |
Logic soft errors: a major barrier to robust platform design S Mitra, M Zhang, TM Mak, N Seifert, V Zia, KS Kim IEEE International Conference on Test, 2005., 10 pp.-696, 2005 | 54 | 2005 |
Method and apparatus for multi-frequency, multi-phase scan chain KS Kim, LJ Schultz US Patent 5,504,756, 1996 | 46 | 1996 |
System and shadow circuits with output joining circuit S Mitra, M Zhang, TM Mak, Q Shi, KS Kim US Patent 7,278,074, 2007 | 41 | 2007 |
Design for resilience to soft errors and variations M Zhang, TM Mak, J Tschanz, KS Kim, N Seifert, D Lu 13th IEEE International On-Line Testing Symposium (IOLTS 2007), 23-28, 2007 | 41 | 2007 |
Compacting circuit responses S Mitra, KS Kim US Patent 7,185,253, 2007 | 37 | 2007 |