| Assessment of the frequency and nature of erroneous x-ray photoelectron spectroscopy analyses in the scientific literature GH Major, TG Avval, B Moeini, G Pinto, D Shah, V Jain, V Carver, ... Journal of Vacuum Science & Technology A 38 (6), 2020 | 115 | 2020 |
| Introduction to near-ambient pressure x-ray photoelectron spectroscopy characterization of various materials DI Patel, T Roychowdhury, V Jain, D Shah, TG Avval, S Chatterjee, S Bahr, ... Surface Science Spectra 26 (1), 2019 | 69 | 2019 |
| A discussion of approaches for fitting asymmetric signals in X-ray photoelectron spectroscopy (XPS), noting the importance of Voigt-like peak shapes GH Major, TG Avval, DI Patel, D Shah, T Roychowdhury, AJ Barlow, ... Surface and Interface Analysis, 2021 | 27 | 2021 |
| Carbon dioxide gas, CO2 (g), by near-ambient pressure XPS TG Avval, S Chatterjee, S Bahr, P Dietrich, M Meyer, A Thißen, MR Linford Surface Science Spectra 26 (1), 2019 | 22 | 2019 |
| Dimethyl sulfoxide by near-ambient pressure XPS TG Avval, CV Cushman, S Bahr, P Dietrich, M Meyer, A Thißen, ... Surface Science Spectra 26 (1), 2019 | 21 | 2019 |
| Oxygen gas, O2 (g), by near-ambient pressure XPS TG Avval, S Chatterjee, GT Hodges, S Bahr, P Dietrich, M Meyer, ... Surface Science Spectra 26 (1), 2019 | 19 | 2019 |
| Versailles Project on Advanced Materials and Standards interlaboratory study on intensity calibration for x-ray photoelectron spectroscopy instruments using low-density … BP Reed, DJH Cant, SJ Spencer, AJ Carmona-Carmona, A Bushell, ... Journal of Vacuum Science & Technology A 38 (6), 2020 | 17 | 2020 |
| Advanced line shapes in X-Ray photoelectron spectroscopy II GH Major, D Shah, T Avval, V Fernandez, N Fairley, M Linford, J Rouxel The Finite Lorentzian (LF) Line Shape (with some MATLAB code illustrating …, 2020 | 14 | 2020 |
| Practical guide on chemometrics/informatics in x-ray photoelectron spectroscopy (XPS). II. Example applications of multiple methods to the degradation of cellulose and tartaric … TG Avval, H Haack, N Gallagher, D Morgan, P Bargiela, N Fairley, ... Journal of Vacuum Science & Technology A 40 (6), 2022 | 13 | 2022 |
| Practical guide on chemometrics/informatics in x-ray photoelectron spectroscopy (XPS). I. Introduction to methods useful for large or complex datasets TG Avval, N Gallagher, D Morgan, P Bargiela, N Fairley, V Fernandez, ... Journal of Vacuum Science & Technology A 40 (6), 2022 | 12 | 2022 |
| Direct dielectric barrier discharge ionization promotes rapid and simple lubricant oil fingerprinting TO Zuppa Neto, TG Avval, PAO Morais, WC Ellis, SC Chapman, ... Journal of the American Society for Mass Spectrometry 31 (7), 1525-1535, 2020 | 12 | 2020 |
| Semiempirical peak fitting guided by ab initio calculations of X-ray photoelectron spectroscopy narrow scans of chemisorbed, fluorinated silanes BI Johnson, TG Avval, J Wheeler, HC Anderson, A Diwan, KJ Stowers, ... Langmuir 36 (8), 1878-1886, 2020 | 11 | 2020 |
| Calcium fluoride and gold reference by high sensitivity-low energy ion scattering TG Avval, CV Cushman, P Brüner, T Grehl, HH Brongersma, MR Linford Surface Science Spectra 26 (2), 2019 | 11 | 2019 |
| The often-overlooked power of summary statistics in exploratory data analysis: comparison of pattern recognition entropy (PRE) to other summary statistics and introduction of … TG Avval, B Moeini, V Carver, N Fairley, EF Smith, J Baltrusaitis, ... Journal of chemical information and modeling 61 (9), 4173-4189, 2021 | 9 | 2021 |
| Using ellipsometry and x-ray photoelectron spectroscopy for real-time monitoring of the oxidation of aluminum mirrors protected by ultrathin MgF2 layers BI Johnson, TG Avval, GT Hodges, V Carver, K Membreno, DD Allred, ... Astronomical Optics: Design, Manufacture, and Test of Space and Ground …, 2019 | 9 | 2019 |
| Surface analysis insight note. Principal component analysis (PCA) of an X‐ray photoelectron spectroscopy image. The importance of preprocessing B Moeini, TG Avval, N Gallagher, MR Linford Surface and Interface Analysis 55 (11), 798-807, 2023 | 8 | 2023 |
| A tag-and-count approach for quantifying surface silanol densities on fused silica based on atomic layer deposition and high-sensitivity low-energy ion scattering TG Avval, S Průša, CV Cushman, GT Hodges, S Fearn, SH Kim, J Čechal, ... Applied Surface Science 607, 154551, 2023 | 8 | 2023 |
| Oxidation of aluminum thin films protected by ultrathin MgF2 layers measured using spectroscopic ellipsometry and X-ray photoelectron spectroscopy BI Johnson, TG Avval, RS Turley, MR Linford, DD Allred OSA Continuum 4 (3), 879-895, 2021 | 8 | 2021 |
| Polyethylene terephthalate by near-ambient pressure XPS TG Avval, GT Hodges, J Wheeler, DH Ess, S Bahr, P Dietrich, M Meyer, ... Surface Science Spectra 27 (1), 2020 | 8 | 2020 |
| Zinc and copper, by high sensitivity-low energy ion scattering TG Avval, S Průša, SC Chapman, MR Linford, T Šikola, HH Brongersma Surface Science Spectra 28 (1), 2021 | 7 | 2021 |
Matthew LinfordBrigham Young UniversityVerified email at chem.byu.edu
