Petr Dvorak
Petr Dvorak
Verified email at ceitec.vutbr.cz - Homepage
Title
Cited by
Cited by
Year
Control and near-field detection of surface plasmon interference patterns
P Dvořák, T Neuman, L Brinek, T Šamořil, R Kalousek, P Dub, ...
Nano letters 13 (6), 2558-2563, 2013
522013
Ultrasmooth metallic foils for growth of high quality graphene by chemical vapor deposition
P Procházka, J Mach, D Bischoff, Z Lišková, P Dvořák, M Vaňatka, ...
Nanotechnology 25 (18), 185601, 2014
422014
In-situ magnetic nano-patterning of Fe films grown on Cu (100)
SS Zaman, P Dvořák, R Ritter, A Buchsbaum, D Stickler, HP Oepen, ...
Journal of Applied Physics 110 (2), 024309, 2011
182011
Imaging of near-field interference patterns by aperture-type SNOM–influence of illumination wavelength and polarization state
P Dvořák, Z Édes, M Kvapil, T Šamořil, F Ligmajer, M Hrtoň, R Kalousek, ...
Optics express 25 (14), 16560-16573, 2017
172017
Quantitative 3D phase imaging of plasmonic metasurfaces
J Babocky, A Krizova, L Strbkova, L Kejik, F Ligmajer, M Hrtoň, ...
ACS Photonics 4 (6), 1389-1397, 2017
172017
High-resolution quantitative phase imaging of plasmonic metasurfaces with sensitivity down to a single nanoantenna
P Bouchal, P Dvořák, J Babocky, Z Bouchal, F Ligmajer, M Hrton, ...
Nano letters 19 (2), 1242-1250, 2019
162019
Invited Article: Direct phase mapping of broadband Laguerre-Gaussian metasurfaces
A Faßbender, J Babocký, P Dvořák, V Křápek, S Linden
APL Photonics 3 (11), 110803, 2018
62018
Near-field digital holography: a tool for plasmon phase imaging
P Dvořák, M Kvapil, P Bouchal, Z Édes, T Šamořil, M Hrtoň, F Ligmajer, ...
Nanoscale 10, 21363-21368, 2018
62018
Patterning large area plasmonic nanostructures on nonconductive substrates using variable pressure electron beam lithography
J Babocký, P Dvořák, F Ligmajer, M Hrtoň, T Šikola, J Bok, J Fiala
Journal of Vacuum Science & Technology B, Nanotechnology and …, 2016
42016
Effect of deposition angle on fabrication of plasmonic gold nanocones and nanodiscs
J Liška, F Ligmajer, L Kejík, M Kvapil, P Dvořák, M Horký, NS Leitner, ...
Microelectronic Engineering 228, 111326, 2020
2020
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