Alan Hartman
TitleCited byYear
Problems and algorithms for covering arrays
A Hartman, L Raskin
Discrete Mathematics 284 (1), 149-156, 2004
2492004
Software and hardware testing using combinatorial covering suites
A Hartman
Graph Theory, Combinatorics and Algorithms, 237-266, 2005
1882005
The AGEDIS tools for model based testing
A Hartman, K Nagin
ACM SIGSOFT Software Engineering Notes 29 (4), 129-132, 2004
1612004
Using a model-based test generator to test for standard conformance
E Farchi, A Hartman, SS Pinter
IBM systems journal 41 (1), 89-110, 2002
1422002
A study in coverage-driven test generation
M Benjamin, D Geist, A Hartman, Y Wolfsthal, G Mas, R Smeets
Design Automation Conference, 1999. Proceedings. 36th, 970-975, 1999
1351999
Steiner quadruple systems
A Hartman, KT Phelps
Contemporary Design Theory: A Collection of Surveys, 205-240, 1992
1131992
Technique using persistent foci for finite state machine based software test generation
A Hartman, K Nagin, P Kram
US Patent 6,944,848, 2005
1022005
Model based test generation for validation of parallel and concurrent software
A Hartman, A Kirshin, K Nagin, S Olvovsky, A Zlotnick
US Patent 7,089,534, 2006
842006
Projected state machine coverage for software testing
G Friedman, A Hartman, K Nagin, T Shiran
ACM SIGSOFT Software Engineering Notes 27 (4), 134-143, 2002
842002
The fundamental construction for 3-designs
A Hartman
Discrete Mathematics 124 (1-3), 107-132, 1994
771994
Model based test generation tools
A Hartman
Agedis Consortium, URL: http://www. agedis. de/documents …, 2002
732002
Resolvable group divisible designs with block size 3
AM Assaf, A Hartman
Discrete mathematics 77 (1-3), 5-20, 1989
681989
Method and system for integrating test coverage measurements with model based test generation
E Farchi, D Geist, A Hartman, P Kram, K Nagin, Y Shaham-Gafni, S Ur
US Patent 7,272,752, 2007
622007
Using UML for automatic test generation
A Cavarra, C Crichton, J Davies, A Hartman, L Mounier
Proceedings of ISSTA 15, 2002
602002
Reducing the complexity of finite state machine test generation using combinatorial designs
A Hartman, A Kirshin, K Nagin, S Olvovsky
US Patent 7,024,589, 2006
532006
2 nd UML 2 Semantics Symposium: Formal Semantics for UML
M Broy, ML Crane, J Dingel, A Hartman, B Rumpe, B Selic
International Conference on Model Driven Engineering Languages and Systems …, 2006
522006
Optimal parsing of strings
A Hartman, M Rodeh
Combinatorial algorithms on words, 155-167, 1985
501985
Tripling quadruple systems
A Hartman
Ars Combin 10, 255-309, 1980
501980
Recursive use of model based test generation for middleware validation
A Hartman, K Nagin, G Sharon
US Patent 7,117,484, 2006
482006
Halving the complete design
A Hartman
North-Holland Mathematics Studies 149, 207-224, 1987
481987
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