| Prediction of aging impact on electromagnetic susceptibility of an operational amplifier H Huang, A Boyer, SB Dhia, B Vrignon Asia-Pacific International EMC Symposium 2015, 4p., 2015 | 17 | 2015 |
| Electronic counterfeit detection based on the measurement of electromagnetic fingerprint H Huang, A Boyer, SB Dhia Microelectronics Reliability 55 (9), 2050-2054, 2015 | 14 | 2015 |
| The detection of counterfeit integrated circuit by the use of electromagnetic fingerprint H Huang, A Boyer, SB Dhia EMC Europe 2014, 1-5, 2014 | 14 | 2014 |
| Impact of thermal aging on emission of a buck DC-DC converter A Boyer, H Huang, SB Dhia 2014 International Symposium on Electromagnetic Compatibility, Tokyo (EMC'14 …, 2014 | 14 | 2014 |
| Development of predictive models for electromagnetic robustness of electronic components H Huang Institut national des sciences appliquées de Toulouse, 2015 | 7 | 2015 |
| Analysis and modeling of passive device degradation for a long-term electromagnetic emission study of a DC–DC converter H Huang, A Boyer, SB Dhia Microelectronics Reliability 55 (9), 2061-2066, 2015 | 7 | 2015 |
| Passive device degradation models for an electromagnetic emission robustness study of a buck DC-DC converter H Huang, A Boyer, SB Dhia 2015 IEEE International Symposium on Electromagnetic Compatibility (EMC …, 2015 | 6 | 2015 |
| Susceptibility analysis of an operational amplifier using on-chip measurement H Huang, A Boyer, SB Dhia, B Vrignon 2014 International Symposium on Electromagnetic Compatibility, 725-729, 2014 | 4 | 2014 |
| Développement de modèles prédictifs pour la robustesse électromagnétique des composants électroniques H Huang Toulouse, INSA, 2015 | 1 | 2015 |
| IMPACT DU VIEILLISSEMENT THERMIQUE SUR L'EMISSION D'UN CONVERTISSEUR BUCK H Huang, A Boyer, SB Dhia 17ème Colloque International et Exposition sur la Compatibilité …, 2014 | | 2014 |
