Israel Tirkel
Israel Tirkel
Assistant Professor, Ben-Gurion University
כתובת אימייל מאומתת בדומיין bgu.ac.il
כותרת
צוטט על ידי
צוטט על ידי
שנה
In-line inspection impact on cycle time and yield
I Tirkel, N Reshef, G Rabinowitz
IEEE Transactions on Semiconductor Manufacturing 22 (4), 491-498, 2009
292009
Modeling cost benefit analysis of inspection in a production line
I Tirkel, G Rabinowitz
International Journal of Production Economics 147, 38-45, 2014
262014
Forecasting flow time in semiconductor manufacturing using knowledge discovery in databases
I Tirkel
International Journal of Production Research 51 (18), 5536-5548, 2013
252013
Cycle time prediction in wafer fabrication line by applying data mining methods
I Tirkel
2011 IEEE/SEMI Advanced Semiconductor Manufacturing Conference, 1-5, 2011
212011
Yield learning curve models in semiconductor manufacturing
I Tirkel
IEEE transactions on semiconductor manufacturing 26 (4), 564-571, 2013
202013
The relationship between yield and flow time in a production system under inspection
I Tirkel, G Rabinowitz
International journal of production research 50 (14), 3686-3697, 2012
162012
The effectiveness of variability reduction in decreasing wafer fabrication cycle time
I Tirkel
2013 Winter Simulations Conference (WSC), 3796-3805, 2013
142013
Wafer fabrication yield learning and cost analysis based on in-line inspection
I Tirkel, G Rabinowitz, D Price, D Sutherland
International Journal of Production Research 54 (12), 3578-3590, 2016
122016
The efficiency of inspection based on out of control detection in wafer fabrication
I Tirkel
Computers & Industrial Engineering 99, 458-464, 2016
82016
Approximation of single-class queueing networks with downtime-induced traffic variability
R Sagron, D Grosbard, G Rabinowitz, I Tirkel
International Journal of Production Research 53 (13), 3871-3887, 2015
62015
A queuing network model for wafer fabrication using decomposition without aggregation
D Grosbard, A Kalir, I Tirkel, G Rabinowitz
2013 IEEE International Conference on Automation Science and Engineering …, 2013
42013
Quality performance modeling in a deteriorating production system with partially available inspection
I Tirkel, G Rabinowitz
Operations Research Proceedings 2010, 397-402, 2011
42011
Approximating class-departure variability in tandem queues with downtime events: Regression-based variability function
R Sagron, G Rabinowitz, I Tirkel
Computers & Operations Research 88, 161-174, 2017
12017
Scheduling preventive maintenance within a queue time for maximum throughput in semiconductor manufacturing
AA Kalir, I Tirkel
2016 Winter Simulation Conference (WSC), 2750-2761, 2016
12016
Identification of statistical distributions for cycle time in wafer fabrication
I Tirkel, Y Parmet
IEEE Transactions on Semiconductor Manufacturing 30 (1), 90-97, 2016
12016
New LST of inter-departure times in PH/G/1 queue, and extensions to ME/G/1 and G/G/1 queues
R Sagron, Y Kerner, G Rabinowitz, I Tirkel
Computers & Industrial Engineering 135, 518-527, 2019
2019
Throughput and flow-time in a production line with partial machine availability and imperfect quality processing
M Eyal, I Tirkel
2015 Winter Simulation Conference (WSC), 3144-3145, 2015
2015
Optimized inspection capacity for out of control detection in semiconductor manufacturing
I Tirkel
Proceedings of the 2012 Winter Simulation Conference (WSC), 1-8, 2012
2012
Integrative Consideration of Cycle Time and Yield for In-line Inspection Scheduling
I Tirkel
Ben Gurion University of the Negev, 2011
2011
Modeling Quality versus Flow Time due to Inspections
I Tirkel
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מאמרים 1–20