| Trapping characteristics of lanthanum oxide gate dielectric film explored from temperature dependent current–voltage and capacitance–voltage measurements B Sen, H Wong, J Molina-Reyes, H Iwai, JA Ng, K Kakushima, CK Sarkar Solid State Electronics 51, 475-480, 2007 | 59 | 2007 |
| Chemical and morphological characteristics of ALD Al2O3 thin-film surfaces after immersion in pH buffer solutions J Molina-Reyes, BMP Ramos, CZ Islas, WC Arriaga, PR Quintero, ... Journal of The Electrochemical Society 160 (10), B201-B206, 2013 | 42 | 2013 |
| Study on the photocatalytic activity of titanium dioxide nanostructures: Nanoparticles, nanotubes and ultra-thin films J Molina-Reyes, A Romero-Moran, H Uribe-Vargas, B Lopez-Ruiz, ... Catalysis Today 341, 2-12, 2020 | 38 | 2020 |
| Understanding the resistive switching phenomena of stacked Al/Al2O3/Al thin films from the dynamics of conductive filaments J Molina-Reyes, L Hernandez-Martinez Complexity, 8263904, 2017 | 33 | 2017 |
| Influence of selected reactive oxygen species on the photocatalytic activity of TiO2/SiO2 composite coatings processed at low temperature A Romero-Moran, JL Sanchez-Salas, J Molina-Reyes Applied Catalysis B: Environmental 291, 119685, 2021 | 28 | 2021 |
| Analysis of quantum conductance, read disturb and switching statistics in HfO2 RRAM using conductive AFM A Ranjan, N Raghavan, J Molina-Reyes, SJ O'Shea, K Shubhakar, ... Microelectronics Reliability 64, 172-178, 2016 | 25 | 2016 |
| Influence of the Surface Roughness of the Bottom Electrode on the Resistive-Switching Characteristics of Al/Al2O3/Al and Al/Al2O3/W Structures Fabricated on Glass at 300°C J Molina-Reyes, R Valderrama, C Zuñiga, P Rosales, W Calleja, A Torres, ... Microelectronics Reliability 52 (12), 2747-2753, 2014 | 25* | 2014 |
| Physical and electrical characterization of yttrium-stabilized zirconia (YSZ) thin films deposited by sputtering and atomic-layer deposition J Molina-Reyes, H Tiznado, G Soto, M Vargas-Bautista, D Dominguez, ... Journal of Materials Science: Materials in Electronics 29, 15349-15357, 2018 | 24 | 2018 |
| Effects of high-field electrical stress on the conduction properties of ultrathin La2O3 films E Miranda, J Molina-Reyes, Y Kim, H Iwai Applied Physics Letters 86, 232104, 2005 | 23 | 2005 |
| Accurate modeling of gate tunneling currents in Metal-Insulator-Semiconductor capacitors based on ultra-thin atomic-layer deposited Al2O3 and post-metallization annealing J Molina-Reyes, H Uribe-Vargas, R Torres-Torres, PG Mani-Gonzalez, ... Thin Solid Films 638, 48-56, 2017 | 22 | 2017 |
| Single vacancy defect spectroscopy on HfO2 using random telegraph noise signals from scanning tunneling microscopy R Thamankar, N Raghavan, J Molina-Reyes, FM Puglisi, SJO Shea, ... Journal of Applied Physics 119 (8), 084304, 2016 | 21 | 2016 |
| Degradation of high-k La2O3 gate dielectrics using progressive electrical stress E Miranda, J Molina-Reyes, Y Kim, H Iwai Microelectronics Reliability 45, 1365-1369, 2005 | 20 | 2005 |
| CAFM based spectroscopy of stress-induced defects in HfO2 with experimental evidence of the clustering model and metastable vacancy defect state A Ranjan, N Raghavan, K Shubhakar, R Thamankar, J Molina-Reyes, ... Reliability Physics Symposium (IRPS), 2016 IEEE International 1, 7A41-7A47, 2016 | 19 | 2016 |
| High-quality spin-on glass-based oxide as a matrix for embedding HfO2 nanoparticles for metal-oxide-semiconductor capacitors J Molina-Reyes, AL Munoz, W Calleja, P Rosales, A Torres Journal of Materials Science 47, 2248-2255, 2012 | 19 | 2012 |
| Effects of N2-Based Annealing on the Reliability Characteristics of Tungsten/La2O3/Silicon Capacitors J Molina-Reyes, K Tachi, K Kakushima, P Ahmet, K Tsutsui, N Sugii, ... Journal of The Electrochemical Society 154 (5), G110-G116, 2007 | 18 | 2007 |
| Low-Temperature Processing of Thin films based on Rutile TiO2 Nanoparticles for UV Photocatalysis and Bacteria Inactivation J Molina-Reyes, JL Sanchez, C Zuniga, E Mendoza, R Cuahtecontzi, ... Journal of Materials Science 49 (2), 786-793, 2014 | 17 | 2014 |
| Tunneling in sub-5 nm La2O3 films deposited by E-beam evaporation E Miranda, J Molina-Reyes, Y Kim, H Iwai Journal of Non-Crystalline Solids 352, 92-97, 2006 | 14 | 2006 |
| Design and electrochemical characterization of ion-sensitive capacitors with ALD Al 2 O 3 as the sensitive dielectric J Molina-Reyes IEEE Sensors Journal 18 (1), 231-236, 2018 | 13 | 2018 |
| Resistive switching characteristics of MIM structures based on oxygen-variable ultra-thin HfO2 and fabricated at low temperature J Molina-Reyes, R Torres, A Ranjan, KL Pey. Materials Science in Semiconductor Processing 66, 191-199, 2017 | 13 | 2017 |
| Conductance-to-Current-Ratio-Based Parameter Extraction in MOS Leakage Current Models AO Conde, AS Gonzalez, RT Torres, J Molina-Reyes, RS Murphy, ... IEEE Transactions on Electron Devices 63 (10), 3844-3850, 2016 | 13 | 2016 |
SANCHEZ-SALAS J.L.Department of Cehemical and Biological Sciences. UDLAPVerified email at udlap.mx
