GaN-on-Si mm-wave RF devices integrated in a 200mm CMOS Compatible 3-Level Cu BEOL B Parvais, A Alian, U Peralagu, R Rodriguez, S Yadav, A Khaled, ... 2020 IEEE International Electron Devices Meeting (IEDM), 8.1. 1-8.1. 4, 2020 | 27 | 2020 |
From 5G to 6G: Will compound semiconductors make the difference? N Collaert, A Alian, A Banerjee, V Chauhan, RY ElKashlan, B Hsu, ... 2020 IEEE 15th International Conference on Solid-State & Integrated Circuit …, 2020 | 10 | 2020 |
Analysis of gate-metal resistance in CMOS-compatible RF GaN HEMTs RY ElKashlan, R Rodriguez, S Yadav, A Khaled, U Peralagu, A Alian, ... IEEE Transactions on Electron Devices 67 (11), 4592-4596, 2020 | 8 | 2020 |
Two‐dimensional models for quantum effects on short channel electrostatics of lightly doped symmetric double‐gate MOSFETs RY El Kashlan, H Abd El Hamid, YI Ismail IET Circuits, Devices & Systems 12 (4), 341-346, 2018 | 8 | 2018 |
(Plenary) the revival of compound semiconductors and how they will change the world in a 5G/6G era N Collaert, AR Alian, A Banerjee, V Chauhan, RY ElKashlan, B Hsu, ... ECS Transactions 98 (5), 15, 2020 | 7 | 2020 |
Unified quantum and reliability model for ultra-thin double-gate MOSFETs RY ElKashlan, O Samy, A Anis, Y Ismail, H Abdelhamid Silicon 12, 21-28, 2020 | 7 | 2020 |
Back barrier trapping induced resistance dispersion in GaN HEMT: mechanism, modeling, and solutions H Yu, B Parvais, U Peralagu, RY ElKashlan, R Rodriguez, A Khaled, ... 2022 International Electron Devices Meeting (IEDM), 30.6. 1-30.6. 4, 2022 | 6 | 2022 |
DC and RF Characterization of Nano-ridge HBT Technology Integrated on 300 mm Si Substrates S Yadav, A Vais, RY Elkashlan, L Witters, K Vondkar, Y Mols, A Walke, ... 2020 15th European Microwave Integrated Circuits Conference (EuMIC), 89-92, 2021 | 5 | 2021 |
Advanced transistors for high frequency applications B Parvais, U Peralagu, A Vais, AR Alian, L Witters, Y Mols, A Walke, ... ECS Transactions 97 (5), 27, 2020 | 5 | 2020 |
Glaucoma detection from retinal images using generic features: Analysis & results MA Talaat, N Raed, A Medhat, R Ashraf, M Essam, RY ElKashlan, ... Proceedings of the 2019 2nd International Conference on Watermarking and …, 2019 | 4 | 2019 |
mm-Wave GaN-on-Si HEMTs with a PSAT of 3.9W/mm at 28GHz R ElKashlan, A Khaled, S Yadav, H Yu, U Peralagu, AR Alian, N Collaert, ... 2023 IEEE/MTT-S International Microwave Symposium-IMS 2023, 24-27, 2023 | 3 | 2023 |
Impact of channel thickness scaling on the performance of GaN-on-Si RF HEMTs on highly C-doped GaN buffer A Alian, R Rodriguez, S Yadav, U Peralagu, AS Hernandez, V Putcha, ... ESSDERC 2022-IEEE 52nd European Solid-State Device Research Conference …, 2022 | 3 | 2022 |
Linearity assessment of GaN HEMTs on Si using nonlinear characterisation R ElKashlan, A Khaled, R Rodriguez, V Putcha, U Peralagu, AR Alian, ... 2021 16th European Microwave Integrated Circuits Conference (EuMIC), 30-33, 2022 | 3 | 2022 |
Channel Thickness Impact on the Small-and Large-Signal RF Performance of GaN HEMTs on Si with a cGaN Back-Barrier R ElKashlan, A Khaled, R Rodriguez, S Yadav, U Peralagu, AR Alian, ... 2022 IEEE/MTT-S International Microwave Symposium-IMS 2022, 910-913, 2022 | 2 | 2022 |
RF linearity trade-offs for varying T-gate geometries of GaN HEMTs on Si R ElKashlan, A Khaled, R Rodriguez, A Sibaja-Hernandez, U Peralagu, ... International Journal of Microwave and Wireless Technologies 15 (6), 983-992, 2023 | 1 | 2023 |
High Performance mm Wave AlN/GaN MISHEMTs on 200 mm Si Substrate S Yadav, A Alian, R ElKashlan, BJ O’Sullivan, A Khaled, B Kazemi, ... 2023 International Electron Devices Meeting (IEDM), 1-4, 2023 | | 2023 |
A Composite AlGaN/cGaN Back Barrier for mm-Wave GaN-on-Si HEMTs R ElKashlan, H Yu, A Khaled, S Yadav, U Peralagu, AR Alian, N Collaert, ... ESSDERC 2023-IEEE 53rd European Solid-State Device Research Conference …, 2023 | | 2023 |
GaN-on-Si technology for modern wireless communication systems: Optimisation insight using RF characterisation RY ElKashlan | | 2023 |
Transistor modelling for mm-Wave technology pathfinding B Parvais, R ElKashlan, H Yu, A Sibaja-Hernandez, B Vermeersch, ... 2021 International Conference on Simulation of Semiconductor Processes and …, 2021 | | 2021 |
Two dimensional quantum and reliability modelling for lightly doped nanoscale devices R ElKashlan | | 2018 |