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Tonmoy Chakraborty
Tonmoy Chakraborty
Assistant Professor, Department of Physics and Astronomy, University of New Mexico
Verified email at unm.edu - Homepage
Title
Cited by
Cited by
Year
Light-sheet microscopy of cleared tissues with isotropic, subcellular resolution
T Chakraborty, MK Driscoll, E Jeffery, MM Murphy, P Roudot, BJ Chang, ...
Nature Methods 16 (11), 1109-1113, 2019
1782019
Atomic layer deposition growth of a novel mixed-phase barrier for seedless copper electroplating applications
S Kumar, D Greenslit, T Chakraborty, ET Eisenbraun
Journal of Vacuum Science & Technology A 27 (3), 572-576, 2009
532009
Converting lateral scanning into axial focusing to speed up three-dimensional microscopy
T Chakraborty, B Chen, S Daetwyler, BJ Chang, O Vanderpoorten, ...
Light: Science & Applications 9 (1), 165, 2020
482020
Isotropic imaging across spatial scales with axially swept light-sheet microscopy
KM Dean, T Chakraborty, S Daetwyler, J Lin, G Garrelts, O M’Saad, ...
Nature protocols 17 (9), 2025-2053, 2022
462022
Source diversity for transport of intensity phase imaging
T Chakraborty, JC Petruccelli
Optics express 25 (8), 9122-9137, 2017
292017
Development of plasma-enhanced atomic layer deposition grown Ru–WCN mixed phase films for nanoscale diffusion barrier and copper direct-plate applications
D Greenslit, T Chakraborty, E Eisenbraun
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2009
202009
Invetigations of Ultrathin Ru-WCN Mixed Phase Films for Diffusion Barrier and Copper Direct-Plate Applications
DV Greenslit, S Kumar, T Chakraborty, E Eisenbraun
ECS Transactions 13 (8), 63, 2008
192008
Optical convolution for quantitative phase retrieval using the transport of intensity equation
T Chakraborty, JC Petruccelli
Applied optics 57 (1), A134-A141, 2018
152018
Extended depth of focus multiphoton microscopy via incoherent pulse splitting
B Chen, T Chakraborty, S Daetwyler, JD Manton, K Dean, R Fiolka
Biomedical Optics Express 11 (7), 3830-3842, 2020
142020
Microstructure analysis of plasma enhanced atomic layer deposition-grown mixed-phase RuTaN barrier for seedless copper electrodeposition
T Chakraborty, ET Eisenbraun
Journal of Vacuum Science & Technology A 30 (2), 2012
132012
Photoluminescence spectra of thin films containing CdSe/ZnS quantum dots irradiated by 532-nm laser radiation and gamma-rays
SC Sharma, J Murphree, T Chakraborty
Journal of luminescence 128 (11), 1771-1776, 2008
132008
Nucleation and growth characteristics of electroplated Cu on plasma enhanced atomic layer deposition-grown RuTaN direct plate barriers
T Chakraborty, D Greenslit, ET Eisenbraun
Journal of Vacuum Science & Technology B 29 (3), 2011
102011
Axial scanning of dual focus to improve light sheet microscopy
H Dibaji, MNH Prince, Y Yi, H Zhao, T Chakraborty
Biomedical Optics Express 13 (9), 4990-5003, 2022
82022
Axial de-scanning using remote focusing in the detection arm of light-sheet microscopy
H Dibaji, A Kazemi Nasaban Shotorban, RM Grattan, S Lucero, DJ Schodt, ...
Nature Communications 15 (1), 5019, 2024
72024
Light-sheet microscopy with isotropic, sub-micron resolution and solvent-independent large-scale imaging
T Chakraborty, M Driscoll, M Murphy, P Roudot, BJ Chang, S Vora, ...
BioRxiv, 605493, 2019
72019
Signal improved ultra-fast light-sheet microscope for large tissue imaging
MNH Prince, B Garcia, C Henn, Y Yi, EA Susaki, Y Watakabe, T Nemoto, ...
Communications Engineering 3 (1), 59, 2024
32024
Signal Improved ultra-Fast Light-sheet Microscope (SIFT) for large tissue imaging
MNH Prince, B Garcia, C Henn, Y Yi, EA Susaki, Y Watakabe, T Nemoto, ...
Research Square, 2023
32023
Source diversity for contrast transfer function imaging
T Chakraborty, JC Petruccelli
Computational Imaging II 10222, 138-145, 2017
22017
First results of outgas resist family test and correlation between outgas specifications and EUV resist development
YJ Fan, K Maruyama, R Ayothi, T Naruoka, T Chakraborty, D Ashworth, ...
Extreme Ultraviolet (EUV) Lithography VI 9422, 322-330, 2015
22015
Advanced metrology techniques for the characterization of EUV mask blank defects
J Harris-Jones, V Jindal, CC Lin, T Chakraborty, E Stinzianni, R Teki, ...
28th European Mask and Lithography Conference 8352, 329-335, 2012
22012
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Articles 1–20