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Yanan Sun
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Year
N-type carbon-nanotube MOSFET device profile optimization for very large scale integration
Y Sun, V Kursun
Transactions on Electrical and Electronic Materials 12 (2), 43-50, 2011
512011
A novel robust and low-leakage SRAM cell with nine carbon nanotube transistors
Y Sun, H Jiao, V Kursun
IEEE Transactions on very large scale integration (VLSI) Systems 23 (9 …, 2014
302014
Carbon nanotubes blowing new life into NP dynamic CMOS circuits
Y Sun, V Kursun
IEEE Transactions on Circuits and Systems I: Regular Papers 61 (2), 420-428, 2013
282013
Go unary: A novel synapse coding and mapping scheme for reliable ReRAM-based neuromorphic computing
C Ma, Y Sun, W Qian, Z Meng, R Yang, L Jiang
2020 Design, Automation & Test in Europe Conference & Exhibition (DATE …, 2020
202020
Unary coding and variation-aware optimal mapping scheme for reliable ReRAM-based neuromorphic computing
Y Sun, C Ma, Z Li, Y Zhao, J Jiang, W Qian, R Yang, Z He, L Jiang
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2021
172021
ITT-RNA: Imperfection tolerable training for RRAM-crossbar-based deep neural-network accelerator
Z Song, Y Sun, L Chen, T Li, N Jing, X Liang, L Jiang
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2020
172020
Energy-efficient nonvolatile SRAM design based on resistive switching multi-level cells
Y Sun, J Gu, W He, Q Wang, N Jing, Z Mao, W Qian, L Jiang
IEEE Transactions on Circuits and Systems II: Express Briefs 66 (5), 753-757, 2019
162019
Uniform carbon nanotube diameter and nanoarray pitch for VLSI of 16nm p-channel MOSFETs
Y Sun, V Kursun
2011 IEEE/IFIP 19th International Conference on VLSI and System-on-Chip, 226-231, 2011
122011
Monolithic 3D carbon nanotube memory for enhanced yield and integration density
Y Sun, W He, Z Mao, H Jiao, V Kursun
IEEE Transactions on Circuits and Systems I: Regular Papers 67 (7), 2431-2441, 2020
112020
Uniform diameter and pitch co-design of 16nm n-type carbon nanotube channel arrays for VLSI
Y Sun, V Kursun
2011 3rd Asia Symposium on Quality Electronic Design (ASQED), 211-216, 2011
112011
High-yield and robust 9T SRAM cell tolerant to removal of metallic carbon nanotubes
Y Sun, W He, Z Mao, H Jiao, V Kursun
IEEE Transactions on Device and Materials Reliability 17 (1), 20-31, 2017
102017
Digital offset for rram-based neuromorphic computing: A novel solution to conquer cycle-to-cycle variation
Z Meng, W Oian, Y Zhao, Y Sun, R Yang, L Jiang
2021 Design, Automation & Test in Europe Conference & Exhibition (DATE …, 2021
82021
Metallic-CN-removal-tolerant high-yield six-CN-MOSFET SRAM cell for carbon-based embedded memory
Y Sun, W He, Z Mao, H Jiao, V Kursun
IEEE Transactions on Electron Devices 65 (3), 1230-1238, 2018
72018
Low-power and compact NP dynamic CMOS adder with 16nm carbon nanotube transistors
Y Sun, V Kursun
2013 IEEE International Symposium on Circuits and Systems (ISCAS), 2119-2122, 2013
72013
An 8T/Cell FeFET-based nonvolatile SRAM with improved density and sub-fJ backup and restore energy
J Wang, N Xiu, J Wu, Y Chen, Y Sun, H Yang, V Narayanan, S George, ...
2022 IEEE International Symposium on Circuits and Systems (ISCAS), 3408-3412, 2022
62022
Variable strength keeper for high-speed and low-leakage carbon nanotube domino logic
Y Sun, W He, Z Mao, V Kursun
Microelectronics Journal 62, 12-20, 2017
62017
Mslm-rf: A spatial feature enhanced random forest for on-board hyperspectral image classification
S Yuan, Y Sun, W He, Q Gu, S Xu, Z Mao, S Tu
IEEE Transactions on Geoscience and Remote Sensing 60, 1-17, 2022
52022
Design of ternary logic-in-memory based on memristive dual-crossbars
W Liu, Y Sun, W He, Q Wang
2021 IEEE International Symposium on Circuits and Systems (ISCAS), 1-5, 2021
52021
BC-MVLiM: A binary-compatible multi-valued logic-in-memory based on memristive crossbars
Y Sun, Z Li, W Liu, W He, Q Wang, Z Mao
IEEE Transactions on Circuits and Systems I: Regular Papers, 2023
42023
Write or not: Programming scheme optimization for RRAM-based neuromorphic computing
Z Meng, Y Sun, W Qian
Proceedings of the 59th ACM/IEEE Design Automation Conference, 985-990, 2022
42022
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