|Microwave irradiation-assisted deposition of Ga2O3 on III-nitrides for deep-UV optoelectronics|
DNN Piyush Jaiswal, Usman Ul Muazzam, Anamika Singh Pratiyush, Nagaboopathy ...
Applied Physics letters 112 (2), 021105, 2018
|An early in-situ stress signature of the AlN-Si pre-growth interface for successful integration of nitrides with (111) Si|
H Chandrasekar, N Mohan, A Bardhan, KN Bhat, N Bhat, N Ravishankar, ...
Applied Physics Letters 103 (21), 211902, 2013
|Integrating AlGaN/GaN high electron mobility transistor with Si: A comparative study of integration schemes|
N Mohan, Manikant, R Soman, S Raghavan
Journal of Applied Physics 118 (13), 135302, 2015
|Self-assembled gold nanofilms as a simple, recoverable and recyclable catalyst for nitro-reduction|
M Mohan, N Mohan, DK Chand
Journal of Materials Chemistry A 3 (42), 21167-21177, 2015
|Positive Threshold Voltage Shift in AlGaN/GaN HEMTs and E-Mode Operation By O Based Gate Stack Engineering|
SD Gupta, A Soni, V Joshi, J Kumar, R Sengupta, H Khand, B Shankar, ...
IEEE Transactions on Electron Devices 66 (6), 2544-2550, 2019
|Synergistic effect of reactor chemistry and compressive stress on dislocation bending during GaN growth|
M Nagaboopathy, N Ravishankar, S Raghavan
Applied Physics Letters 103 (4), 041912, 2013
|Single-pulse chemical shock tube for ignition delay measurements|
M Nagaboopathy, C Vijayanand, G Hegde, KPJ Reddy, E Arunan
Current science, 78-82, 2008
|Vertical current transport in AlGaN/GaN HEMTs on silicon: Experimental investigation and analytical model|
N Remesh, N Mohan, S Kumar, S Prabhu, I Guiney, CJ Humphreys, ...
IEEE Transactions on Electron Devices 66 (1), 613-618, 2018
|The role of surface roughness on dislocation bending and stress evolution in low mobility AlGaN films during growth|
A Bardhan, N Mohan, H Chandrasekar, P Ghosh, DV Sridhara Rao, ...
Journal of Applied Physics 123 (16), 165108, 2018
|Trap assisted avalanche instability and safe operating area concerns in AlGaN/GaN HEMTs|
B Shankar, A Soni, M Singh, R Soman, H Chandrasekar, N Mohan, ...
2017 IEEE International Reliability Physics Symposium (IRPS), WB-5.1-WB-5.5, 2017
|On the ESD behavior of AlGaN/GaN Schottky diodes and trap assisted failure mechanism|
B Shankar, R Sengupta, SD Gupta, A Soni, N Mohan, N Bhat, ...
2017 39th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 1-6, 2017
|Dislocation bending and stress evolution in Mg-doped GaN films on Si substrates|
R Soman, N Mohan, H Chandrasekar, N Bhat, S Raghavan
Journal of Applied Physics 124 (24), 245104, 2018
|Wafer-scale epitaxial germanium (100),(111),(110) films on silicon using liquid phase crystallization|
S Chaurasia, N Mohan, S Raghavan, S Avasthi
AIP Advances 8 (7), 075010, 2018
|Curvature management in buffer layer for device quality GaN growth on Si (111)|
A Bardhan, N Mohan, R Soman, Manikant, S Raghavan
IETE Technical Review 33 (1), 82-87, 2016
|Structure and morphology studies of chromium film at elevated temperature in hypersonic environment|
GM Hegde, V Kulkarni, M Nagaboopathy, KPJ Reddy
Bulletin of Materials Science 35 (3), 341-345, 2012
|Ignition delay studies on hydrocarbon fuel with and without additives|
M Nagaboopathy, G Hegde, KPJ Reddy, C Vijayanand, M Agarwal, ...
Shock Waves, 745-750, 2009
|Discovery of carbon nanotubes in sixth century BC potteries from Keeladi, India|
M Kokarneswaran, P Selvaraj, T Ashokan, S Perumal, P Sellappan, ...
Scientific Reports 10 (1), 1-6, 2020
|Optimum Carbon Concentration in GaN-on-Silicon for Breakdown Enhancement in AlGaN/GaN HEMTs|
N Remesh, N Mohan, S Raghavan, R Muralidharan, DN Nath
IEEE Transactions on Electron Devices, 2020
|2DEG behavior of AlGaN/GaN HEMTs on various transition buffers|
Manikant, N Mohan, R Soman, H Chandrasaker, S Raghavan
Emerging Electronics (ICEE), 2014 IEEE 2nd International Conference on, 1-4, 2014
|Platform of large metal nitride islands with lateral orientations and low-defect density|
S Raghavan, H Chandrasekar, N Mohan, D Shakthivel
US Patent 10,854,719, 2020