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Co-authors
Asuman OzdaglarEECS, MITVerified email at mit.edu- Alex OlshevskyAssociate Professor, Boston UniversityVerified email at bu.edu
- Dimitri BertsekasMassachusetts Institute of TechnologyVerified email at mit.edu
- Uday V. ShanbhagProfessor, Industrial and Manufacturing Engineering, Pennsylvania State UniversityVerified email at psu.edu
- Venugopal V. VeeravalliHenry Magnuski Professor, ECE, University of Illinois at Urbana-ChampaignVerified email at illinois.edu
- Tamer BaşarSwanlund Endowed Chair & CAS Professor of Electrical and Computer EngineeringVerified email at illinois.edu
- Behrouz TouriAssistant ProfessorVerified email at ucsd.edu
- César A. UribeRice UniversityVerified email at rice.edu
- Ji LiuStony Brook UniversityVerified email at stonybrook.edu
- Soomin LeeYahoo Research / Verizon MediaVerified email at verizonmedia.com
- Farzad YousefianAssistant Professor, Oklahoma State UniversityVerified email at okstate.edu
- Wei (Wilbur) ShiPostdoctoral Research Associate, Princeton UniversityVerified email at princeton.edu
- Anna ScaglioneProfessor of Electrical and Computer Engineering, ASUVerified email at asu.edu
- Jayash KoshalApplied Scientist, Amazon.comVerified email at illinois.edu
- Carolyn L BeckProfessor of Industrial Engineering, University of Illinois at Urbana-ChampaignVerified email at illinois.edu
- Pablo A. ParriloProfessor of Electrical Engineering and Computer Science, Massachusetts Institute of TechnologyVerified email at mit.edu
- Philip E. ParéPurdue UniversityVerified email at purdue.edu
- John TsitsiklisProfessor of Electrical Engineering, MITVerified email at mit.edu
- kunal srivastavaUniversity of Illinois Urbana-Champaign, United Technologies Research CenterVerified email at utrc.utc.com
- Alexander GasnikovMIPTVerified email at mipt.ru
