| Parametric identification of transfer functions in the frequency domain-a survey R Pintelon, P Guillaume, Y Rolain, J Schoukens, H Van Hamme IEEE transactions on automatic control 39 (11), 2245-2260, 1994 | 678 | 1994 |
| Identification of linear systems with nonlinear distortions J Schoukens, R Pintelon, T Dobrowiecki, Y Rolain Automatica 41 (3), 491-504, 2005 | 249 | 2005 |
| Low-area active-feedback low-noise amplifier design in scaled digital CMOS J Borremans, P Wambacq, C Soens, Y Rolain, M Kuijk IEEE Journal of Solid-State Circuits 43 (11), 2422-2433, 2008 | 222 | 2008 |
| Mastering system identification in 100 exercises J Schoukens, R Pintelon, Y Rolain John Wiley & Sons, 2012 | 152 | 2012 |
| A 52 GHz phased-array receiver front-end in 90 nm digital CMOS K Scheir, S Bronckers, J Borremans, P Wambacq, Y Rolain IEEE Journal of Solid-State Circuits 43 (12), 2651-2659, 2008 | 145 | 2008 |
| Fast approximate identification of nonlinear systems J Schoukens, JG Németh, P Crama, Y Rolain, R Pintelon Automatica 39 (7), 1267-1274, 2003 | 143 | 2003 |
| A 57-to-66GHz quadrature PLL in 45nm digital CMOS K Scheir, G Vandersteen, Y Rolain, P Wambacq 2009 IEEE International Solid-State Circuits Conference-Digest of Technical …, 2009 | 137 | 2009 |
| A large-signal network analyzer: Why is it needed? W Van Moer, Y Rolain IEEE Microwave Magazine 7 (6), 46-62, 2006 | 102 | 2006 |
| Frequency response function measurements in the presence of nonlinear distortions J Schoukens, R Pintelon, Y Rolain, T Dobrowiecki Automatica 37 (6), 939-946, 2001 | 95 | 2001 |
| Best conditioned parametric identification of transfer function models in the frequency domain Y Rolain, R Pintelon, KQ Xu, H Vold IEEE Transactions on Automatic Control 40 (11), 1954-1960, 1995 | 95 | 1995 |
| Parametric identification of parallel Hammerstein systems M Schoukens, R Pintelon, Y Rolain IEEE Transactions on Instrumentation and Measurement 60 (12), 3931-3938, 2011 | 86 | 2011 |
| Experimental characterization of operational amplifiers: a system identification approach-Part I: theory and simulations R Pintelon, G Vandersteen, L De Locht, Y Rolain, J Schoukens IEEE Transactions on Instrumentation and Measurement 53 (3), 854-862, 2004 | 84 | 2004 |
| Fully automated spectral analysis of periodic signals J Schoukens, Y Rolain, G Simon, R Pintelon IEEE Transactions on Instrumentation and Measurement 52 (4), 1021-1024, 2003 | 80 | 2003 |
| Analysis of windowing/leakage effects in frequency response function measurements J Schoukens, Y Rolain, R Pintelon Automatica 42 (1), 27-38, 2006 | 79 | 2006 |
| Broadband versus stepped sine FRF measurements J Schoukens, R Pintelon, Y Rolain IMTC/99. Proceedings of the 16th IEEE Instrumentation and Measurement …, 1999 | 78 | 1999 |
| Improved (non-) parametric identification of dynamic systems excited by periodic signals—The multivariate case R Pintelon, G Vandersteen, J Schoukens, Y Rolain Mechanical Systems and Signal Processing 25 (8), 2892-2922, 2011 | 75 | 2011 |
| Identification of Wiener–Hammerstein systems by a nonparametric separation of the best linear approximation M Schoukens, R Pintelon, Y Rolain Automatica 50 (2), 628-634, 2014 | 72 | 2014 |
| Multirate cascaded discrete-time low-pass ΔΣ modulator for GSM/Bluetooth/UMTS L Bos, G Vandersteen, P Rombouts, A Geis, A Morgado, Y Rolain, ... IEEE Journal of Solid-State Circuits 45 (6), 1198-1208, 2010 | 67 | 2010 |
| Analyses, development, and applications of TLS algorithms in frequency domain system identification R Pintelon, P Guillaume, G Vandersteen, Y Rolain SIAM journal on matrix analysis and applications 19 (4), 983-1004, 1998 | 64 | 1998 |
| Parametric identification of parallel Wiener–Hammerstein systems M Schoukens, A Marconato, R Pintelon, G Vandersteen, Y Rolain Automatica 51, 111-122, 2015 | 60 | 2015 |
Rik PintelonProfessor in electrical engineering, Vrije Universiteit Brussel, dept. ELECVerified email at vub.ac.be
