Brian Murray
Brian Murray
ZF Friedrichshafen
Verified email at zf.com - Homepage
Title
Cited by
Cited by
Year
Hierarchical test generation using precomputed tests for modules
BT Murray, JP Hayes
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 1990
2761990
Low-cost on-line fault detection using control flow assertions
R Venkatasubramanian, JP Hayes, BT Murray
9th IEEE On-Line Testing Symposium, 2003. IOLTS 2003., 137-143, 2003
1912003
Testing ICs: Getting to the core of the problem
BT Murray, JP Hayes
Computer 29 (11), 32-38, 1996
1261996
Online BIST for embedded systems
H Al-Asaad, BT Murray, JP Hayes
IEEE design & Test of Computers 15 (4), 17-24, 1998
1131998
Transparent recovery from intermittent faults in time-triggered distributed systems
N Kandasamy, JP Hayes, BT Murray
IEEE Transactions on Computers 52 (2), 113-125, 2003
972003
Multi-module control-by-wire architecture
BT Murray, JG D'ambrosio, SA Millsap, MD Byers, RJ Disser, JA Heinrichs, ...
US Patent 6,424,900, 2002
942002
Built-in self testing of sequential circuits using precomputed test sets
V Iyengar, K Chakrabarty, BT Murray
Proceedings. 16th IEEE VLSI Test Symposium (Cat. No. 98TB100231), 418-423, 1998
931998
Built-in test pattern generation for high-performance circuits using twisted-ring counters
K Chakrabarty, BT Murray, V Iyengar
Proceedings 17th IEEE VLSI Test Symposium (Cat. No. PR00146), 22-27, 1999
701999
A system-safety process for by-wire automotive systems
S Amberkar, JG D'Ambrosio, BT Murray, J Wysocki, BJ Czerny
SAE transactions, 348-353, 2000
662000
Deterministic built-in pattern generation for sequential circuits
V Iyengar, K Chakrabarty, BT Murray
Journal of Electronic Testing 15 (1), 97-114, 1999
631999
Optimal zero-aliasing space compaction of test responses
K Chakrabarty, BT Murray, JP Hayes
IEEE Transactions on Computers 47 (11), 1171-1187, 1998
631998
Circuit with built-in test and method thereof
BT Murray, K Chakrabarty, JP Hayes
US Patent 5,790,562, 1998
601998
Codesign of architectures for automotive powertrain modules
X Hu, JG D'Ambrosio, BT Murray, DL Tang
IEEE Micro 14 (4), 17-25, 1994
581994
Deterministic built-in test pattern generation for high-performance circuits using twisted-ring counters
K Chakrabarty, BT Murray, V Iyengar
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 8 (5), 633-636, 2000
572000
Dependable communication synthesis for distributed embedded systems
N Kandasamy, JP Hayes, BT Murray
International Conference on Computer Safety, Reliability, and Security, 275-288, 2003
552003
Alzheimer’s protective A2T mutation changes the conformational landscape of the Aβ1–42 monomer differently than does the A2V mutation
P Das, B Murray, G Belfort
Biophysical journal 108 (3), 738-747, 2015
532015
Design of built-in test generator circuits using width compression
K Chakrabarty, BT Murray
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 1998
451998
Test width compression for built-in self testing
K Chakrabarty, BT Murray, J Liu, M Zhu
Proceedings International Test Conference 1997, 328-337, 1997
411997
Optimal space compaction of test responses
K Chakrabarty, BT Murray, JP Hayes
Proceedings of 1995 IEEE International Test Conference (ITC), 834-843, 1995
401995
Test propagation through modules and circuits
BT Murray, JP Hayes
1991, Proceedings. International Test Conference, 748, 1991
391991
The system can't perform the operation now. Try again later.
Articles 1–20