Simon Korman
Title
Cited by
Cited by
Year
Coherency sensitive hashing
S Korman, S Avidan
IEEE transactions on pattern analysis and machine intelligence (TPAMI), 2016
2192016
Coherency sensitive hashing
S Korman, S Avidan
the IEEE International Conference on Computer Vision (ICCV), 2011
219*2011
Fast-match: Fast affine template matching
S Korman, D Reichman, G Tsur, S Avidan
the IEEE Conference on Computer Vision and Pattern Recognition (CVPR), 2013
1782013
Inverting RANSAC: Global model detection via inlier rate estimation
R Litman, S Korman, A Bronstein, S Avidan
the IEEE conference on computer vision and pattern recognition (CVPR), 2015
312015
On the use of randomization in the online set cover problem
S Korman
Master's thesis, Weizmann Institute of Science, Rehovot, Israel, 2004
312004
Probably approximately symmetric: Fast rigid symmetry detection with global guarantees
S Korman, R Litman, S Avidan, A Bronstein
Computer Graphics Forum (CGF), 2015
20*2015
Latent RANSAC
S Korman, R Litman
the IEEE Conference on Computer Vision and Pattern Recognition (CVPR), 2018
162018
OATM: Occlusion Aware Template Matching by Consensus Set Maximization
S Korman, Simon and Milam, Mark and Soatto
The IEEE Conference on Computer Vision and Pattern Recognition (CVPR), 2018
11*2018
DCSH-matching patches in RGBD images
Y Eshet, S Korman, E Ofek, S Avidan
the IEEE International Conference on Computer Vision (ICCV), 2013
102013
Deleting and Testing Forbidden Patterns in Multi-Dimensional Arrays
O Ben-Eliezer, S Korman, D Reichman
International Colloquium on Automata, Languages, and Programming (ICALP), 2017
9*2017
Tight approximation of image matching
S Korman, D Reichman, G Tsur
arXiv preprint arXiv:1111.1713, 2011
82011
On the use of randomness in the online set cover problem
S Korman
Unpublished M. Sc. thesis, Weizmann Institute of Science, Rehovot, Israel, 2005
52005
Peeking template matching for depth extension
S Korman, E Ofek, S Avidan
the IEEE International Conference on Computer Vision (ICCV), 2015
42015
Peeking Template Matching for Depth Extension–Supplementary materials–
S Korman, E Ofek, S Avidan
GMD: Global Model Detection via Inlier Rate Estimation
R Litman, S Korman, A Bronstein, S Avidan
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Articles 1–15