| DEoptim: An R package for global optimization by differential evolution K Mullen, D Ardia, DL Gil, D Windover, J Cline Journal of Statistical Software 40 (6), 1-26, 2011 | 739 | 2011 |
| Certification of standard reference material 660B DR Black, D Windover, A Henins, J Filliben, JP Cline Powder Diffraction 26 (2), 155-158, 2011 | 88 | 2011 |
| High-rate sputter deposited tantalum coating on steel for wear and erosion mitigation SL Lee, D Windover, M Audino, DW Matson, ED McClanahan Surface and Coatings Technology 149 (1), 62-69, 2002 | 73 | 2002 |
| Analysis of magnetron-sputtered tantalum coatings versus electrochemically deposited tantalum from molten salt SL Lee, M Cipollo, D Windover, C Rickard Surface and Coatings Technology 120, 44-52, 1999 | 72 | 1999 |
| High-precision measurement of the x-ray Cu Kα spectrum MH Mendenhall, A Henins, LT Hudson, CI Szabo, D Windover, JP Cline Journal of Physics B: Atomic, Molecular and Optical Physics 50 (11), 115004, 2017 | 62 | 2017 |
| Effect of sputtering parameters on Ta coatings for gun bore applications DW Matson, ED McClanahan, JP Rice, SL Lee, D Windover Surface and Coatings Technology 133, 411-416, 2000 | 57 | 2000 |
| Properties of thick sputtered Ta used for protective gun tube coatings DW Matson, ED McClanahan, SL Lee, D Windover Surface and Coatings Technology 146, 344-350, 2001 | 56 | 2001 |
| Phase, residual stress, and texture in triode-sputtered tantalum coatings on steel SL Lee, D Windover Surface and Coatings Technology 108, 65-72, 1998 | 50 | 1998 |
| Metrological tools for the reference materials and reference instruments of the NIST material measurement laboratory CR Beauchamp, JE Camara, J Carney, SJ Choquette, KD Cole, ... NIST Special Publication 260, 136, 2020 | 47 | 2020 |
| Certification of NIST standard reference material 640d DR Black, D Windover, A Henins, D Gil, J Filliben, JP Cline Powder Diffraction 25 (2), 187-190, 2010 | 34 | 2010 |
| X-ray scattering critical dimensional metrology using a compact x-ray source for next generation semiconductor devices RJ Kline, DF Sunday, D Windover, BD Bunday Journal of Micro/Nanolithography, MEMS, and MOEMS 16 (1), 014001-014001, 2017 | 31 | 2017 |
| Advancing x-ray scattering metrology using inverse genetic algorithms AF Hannon, DF Sunday, D Windover, R Joseph Kline Journal of Micro/Nanolithography, MEMS, and MOEMS 15 (3), 034001-034001, 2016 | 27 | 2016 |
| Standard reference material 660b for X-ray metrology DR Black, D Windover, A Henins, J Filliben, JP Cline Adv. X-ray Anal. 54, 140-148, 2010 | 26 | 2010 |
| In situ phase evolution study in magnetron sputtered tantalum thin films SL Lee, D Windover, TM Lu, M Audino Thin Solid Films 420, 287-294, 2002 | 25 | 2002 |
| The optics and alignment of the divergent beam laboratory X-ray powder diffractometer and its calibration using NIST standard reference materials JP Cline, MH Mendenhall, D Black, D Windover, A Henins Journal of research of the National Institute of Standards and Technology …, 2015 | 24 | 2015 |
| Energy-dispersive, x-ray reflectivity density measurements of porous xerogels D Windover, TM Lu, SL Lee, A Kumar, H Bakhru, C Jin, W Lee Applied Physics Letters 76 (2), 158-160, 2000 | 23 | 2000 |
| Thin film density determination by multiple radiation energy dispersive X-ray reflectivity D Windover, E Barnat, JY Kim, M Nielsen, TM Lu, A Kumar, H Bakhru, ... International Centre for Diffraction Data, Advances in X-ray Analysis 42 …, 2000 | 21 | 2000 |
| Characterization of a self-calibrating, high-precision, stacked-stage, vertical dual-axis goniometer MH Mendenhall, A Henins, D Windover, JP Cline Metrologia 53 (3), 933, 2016 | 20 | 2016 |
| Structural study of a low dielectric thin film using X-ray reflectivity and grazing incidence small angle X-ray scattering CH Hsu, US Jeng, HY Lee, CM Huang, KS Liang, D Windover, TM Lu, ... Thin Solid Films 472 (1-2), 323-327, 2005 | 20 | 2005 |
| Limitations of x-ray reflectometry in the presence of surface contamination DL Gil, D Windover Journal of Physics D: Applied Physics 45 (23), 235301, 2012 | 19 | 2012 |
James P ClineNational Institute of Standards and TechnologyVerified email at nist.gov
