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Dr Savita Maurya Shah
Dr Savita Maurya Shah
Intel Corporation
Verified email at iiita.ac.in
Title
Cited by
Cited by
Year
Effect of zero bias Gamma ray irradiation on HfO2 thin films
S Maurya
Journal of Materials Science Materials in Electronics, 2016
312016
Metal-oxide Based Ammonia Gas Sensors - A Review
PNKVV Gupta Priya, Maurya Savita
Nanoscience & Nanotechnology-Asia 11 (3), 270-289, 2020
15*2020
Structural, electrical and humidity sensing properties of nano-structured nickel oxide prepared by sol–gel method
P Gupta, S Maurya, NK Pandey, V Verma
Journal of Materials Science: Materials in Electronics 32 (3), 3529-3542, 2021
102021
Engineering of silicon/HfO2 interface by variable energy proton irradiation
S Maurya, LC Tribedi, R Maringanti
Applied Physics Letters 105, 071605, 2014
82014
A Review of Energy Harvesting Techniques for WSN
S Maurya, P Suman, M Radhakrishna
8th International Conference on Wireless Comm & Sensor Networks (WCSN-2012) 8, 2012
82012
Interface modification by irradiation with alpha particles
S Maurya
Journal of Materials Science: Materials in Electronics, 2017
62017
Silicon/HfO2 interface: Effects of gamma irradiation
S Maurya
AIP Conference Proceedings 1731 (1), 120034-120036, 2016
62016
Effect of pre-deposition annealing on the performance of MIS capacitor formed using atomic layer deposition of ultrathin
S Maurya, BR Singh, M Radhakrishna
AIP Conference Proceedings 1536 (1), 1159-1160, 2013
62013
Effect of zero bias, 2.7 MeV proton irradiation on HfO2
S Maurya, S Awasthi
Journal of Radioanalytical and Nuclear Chemistry 318, 947-953, 2018
52018
Study of Atomic Layer Deposited HfO2/Si Interfaces for their Quality, Reliability and Radiation based Interface Modifications’
S Maurya
Indian Institute of Information Technology, Allahabad, India, 2015
4*2015
GaAs solar cell performance improvement by design optimization using NSGA approach
K Saraswat, T Usmani, S Maurya
Materials Today: Proceedings 51, 178-185, 2022
32022
Half-metallic ferromagnetism in Fe, Co and Ni doped BaS: First principles calculations
S Maurya, R Sharma, KC Bhamu
AIP Conference Proceedings 1942 (1), 2018
32018
Silicon/HfO2 interface: Effects of proton irradiation
S Maurya, R M
59th DAE Solid State Physics Symposium, SSPS-2014, AIP Conference …, 2015
32015
Effect of multilayer structure on electromechanical characteristics of RF MEMS capacitive Symmetric Toggle Switch for X-band applications
K Maninder, KJ Rangra, D Kumar, S Kumar, N Girdhar, P Boora, ...
Proceeding of ISSS-08 held on July, 24-26, 2008
32008
Effect of nitrogen passivation/pre nitration on interface properties of atomic layer deposited HfO2
S Maurya
Journal of Materials Science: Materials in Electronics 29 (9), 7917-7923, 2018
22018
Challenges Beyond 100 NM MOS Devices
S Maurya, S Shrivastava
Journal of VLSI Design Tools & Technology 6 (2), 1-4, 2016
22016
An Extensive Study, Design And Simulation Of Mems Guided Media: Microstrip Line
S Maurya
International Journal on Smart Sensing and Intelligent Systems 3 (1), 88-93, 2010
22010
Life Cycle Performance & Analysis of 100kw Solar PV Plant
M Tahseen, P Charan, S Maurya, M Asim
Life 8 (7), 2018
12018
Analysis of Leakage Current in Extremely Scaled HfO2 Gate Stack Deposited by ALD
S MAURYA, SINGH, B R, M RADHAKRISHNA
IMPACT: International Journal of Research in Engineering & Technology 2 (3 …, 2014
12014
Impact of fringing field on the C-V characterization of HfO2HfO2 high-κ dielectric MOS (p) capacitors fabricated through atomic layer deposition
S Maurya, BR Singh, M Radhakrishna
AIP Conf. Proc. 1512, 742, 2013
12013
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