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Anna Maria Szekeres
Anna Maria Szekeres
Institute of Solid State Physics, Bulgarian Academy of Sciences
Verified email at issp.bas.bg
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Cited by
Year
Optical properties of chemical vapor deposited thin films of molybdenum and tungsten based metal oxides
K Gesheva, A Szekeres, T Ivanova
Solar energy Materials and Solar cells 76 (4), 563-576, 2003
1872003
Evaluation of basic physical parameters of quaternary Ge–Sb-(S, Te) chalcogenide glasses
V Pamukchieva, A Szekeres, K Todorova, M Fabian, E Svab, Z Revay, ...
Journal of non-crystalline solids 355 (50-51), 2485-2490, 2009
812009
Structure and optical properties of CVD molybdenum oxide films for electrochromic application
T Ivanova, K Gesheva, A Szekeres
Journal of Solid State Electrochemistry 7 (1), 21-24, 2002
782002
Structural and optical properties of CVD thin tungsten oxide films
D Gogova, K Gesheva, A Szekeres, M Sendova‐Vassileva
physica status solidi (a) 176 (2), 969-984, 1999
681999
Structural transformations and their relation to the optoelectronic properties of chromium oxide thin films
T Ivanova, K Gesheva, A Cziraki, A Szekeres, E Vlaikova
Journal of Physics: Conference Series 113 (1), 012030, 2008
652008
Spectroscopic ellipsometry study of CVD molybdenum oxide films: effect of temperature
A Szekeres, T Ivanova, K Gesheva
Journal of Solid State Electrochemistry 7 (1), 17-20, 2002
612002
Spectroscopic characterization of CVD-molybdenum oxide films
T Ivanova, A Szekeres, M Gartner, D Gogova, KA Gesheva
Electrochimica acta 46 (13-14), 2215-2219, 2001
552001
Crystallization of chemically vapor deposited molybdenum and mixed tungsten/molybdenum oxide films for electrochromic application
KA Gesheva, A Cziraki, T Ivanova, A Szekeres
Thin Solid Films 515 (11), 4609-4613, 2007
542007
Study of the surface roughness of CVD-tungsten oxide thin films
RE Tanner, A Szekeres, D Gogova, K Gesheva
Applied surface science 218 (1-4), 163-169, 2003
462003
Deposition of silicon oxide thin films in TEOS with addition of oxygen to the plasma ambient: IR spectra analysis
F Hamelmann, U Heinzmann, A Szekeres, N Kirov, T Nikolova
Journal of Optoelectronics and Advanced Materials 7 (1), 389-392, 2005
432005
Structural characterization of AlN films synthesized by pulsed laser deposition
A Szekeres, Z Fogarassy, P Petrik, E Vlaikova, A Cziraki, G Socol, ...
Applied Surface Science 257 (12), 5370-5374, 2011
422011
Plasma-assisted chemical vapor deposited silicon oxynitride as an alternative material for gate dielectric in MOS devices
A Szekeres, T Nikolova, S Simeonov, A Gushterov, F Hamelmann, ...
Microelectronics journal 37 (1), 64-70, 2006
372006
The effect of O2 plasma on properties of the SiSiO2 system
A Szekeres, S Alexandrova, K Kirov
physica status solidi (a) 62 (2), 727-736, 1980
351980
Influence of in situ nitrogen pressure on crystallization of pulsed laser deposited AlN films
S Bakalova, A Szekeres, A Cziraki, CP Lungu, S Grigorescu, G Socol, ...
Applied surface science 253 (19), 8215-8219, 2007
322007
Plasma photoresist stripping in a planar reactor
A Szekeres, K Kirov, S Alexandrova
Physica Status Solidi. A, Applied Research 63 (1), 371-374, 1981
301981
Optical and electrochromic characterization of multilayered mixed metal oxide thin films
F Hamelmann, K Gesheva, T Ivanova, A Szekeres, M Abroshev, ...
J. Optoelectron. Adv. Mater. 7, 393-396, 2005
292005
Optical properties of GexSb20− xTe80 thin films and their changes by light illumination
V Pamukchieva, A Szekeres
Optical Materials 30 (7), 1088-1092, 2008
282008
Compositional dependence of the optical properties of new quaternary chalcogenide glasses of Ge–Sb–(S, Te) system
V Pamukchieva, A Szekeres, K Todorova, E Svab, M Fabian
Optical Materials 32 (1), 45-48, 2009
272009
Study of As2Se3 and As2Se2Te glass structure by neutron-and X-ray diffraction methods
M Fabian, E Sváb, V Pamukchieva, A Szekeres, S Vogel, U Ruett
Journal of Physics: Conference Series 253 (1), 012053, 2010
252010
Enhanced gas sensing of Au nanocluster-doped or-coated zinc oxide thin films
G Socol, E Axente, C Ristoscu, F Sima, A Popescu, N Stefan, ...
Journal of Applied Physics 102 (8), 083103, 2007
252007
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