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E Peter Münger
E Peter Münger
Verified email at nsc.liu.se
Title
Cited by
Cited by
Year
Phase control of Al2O3 thin films grown at low temperatures
JM Andersson, E Wallin, U Helmersson, U Kreissig, EP Münger
Thin solid films 513 (1-2), 57-59, 2006
1302006
Energy distributions of positive and negative ions during magnetron sputtering of an Al target in Ar∕ O2 mixtures
JM Andersson, E Wallin, EP Münger, U Helmersson
Journal of applied physics 100 (3), 2006
692006
Ab initio studies of Al, O, and adsorption on surfaces
E Wallin, JM Andersson, EP Münger, V Chirita, U Helmersson
Physical Review B 74 (12), 125409, 2006
522006
Composition, structure, and dielectric tunability of epitaxial thin films grown by radio frequency magnetron sputtering
X Wang, U Helmersson, LD Madsen, IP Ivanov, P Münger, S Rudner, ...
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 17 (2 …, 1999
521999
Low‐temperature deposition of cubic BN:C films by unbalanced direct current magnetron sputtering of a B4C target
MP Johansson, I Ivanov, L Hultman, EP Münger, A Schütze
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 14 (6 …, 1996
521996
Reweighting in Monte Carlo and Monte Carlo renormalization-group studies
EP Münger, MA Novotny
Physical Review B 43 (7), 5773, 1991
491991
Species‐rich ecosystems are vulnerable to cascading extinctions in an increasingly variable world
L Kaneryd, C Borrvall, S Berg, A Curtsdotter, A Eklöf, C Hauzy, T Jonsson, ...
Ecology and evolution 2 (4), 858-874, 2012
462012
Unravelling the physical mechanisms that determine microstructural evolution of ultrathin Volmer-Weber films
V Elofsson, B Lü, D Magnfält, EP Münger, K Sarakinos
Journal of Applied Physics 116 (4), 2014
432014
Dynamic competition between island growth and coalescence in metal-on-insulator deposition
B Lü, V Elofsson, EP Münger, K Sarakinos
Applied Physics Letters 105 (16), 2014
392014
Ab initio calculations on the effects of additives on alumina phase stability
JM Andersson, E Wallin, V Chirita, EP Münger, U Helmersson
Physical Review B 71 (1), 014101, 2005
392005
Reptation: a mechanism for cluster migration on (111) face-centered-cubic metal surfaces
V Chirita, EP Münger, JE Greene, JE Sundgren
Surface science 436 (1-3), L641-L647, 1999
371999
Climate change in metacommunities: dispersal gives double-sided effects on persistence
A Eklöf, L Kaneryd, P Münger
Philosophical Transactions of the Royal Society B: Biological Sciences 367 …, 2012
292012
Kinetic pathways leading to layer-by-layer growth from hyperthermal atoms: A multibillion time step molecular dynamics study
D Adamović, V Chirita, EP Münger, L Hultman, JE Greene
Physical Review B 76 (11), 115418, 2007
292007
Low-energy ion irradiation during film growth: Kinetic pathways leading to enhanced adatom migration rates
D Adamovic, EP Münger, V Chirita, L Hultman, JE Greene
Applied Physics Letters 86 (21), 2005
242005
Coalescence-controlled and coalescence-free growth regimes during deposition of pulsed metal vapor fluxes on insulating surfaces
B Lü, EP Münger, K Sarakinos
Journal of Applied Physics 117 (13), 2015
222015
Catalytic nanotruss structures realized by magnetic self-assembly in pulsed plasma
S Ekeroth, EP Münger, R Boyd, J Ekspong, T Wågberg, L Edman, ...
Nano Letters 18 (5), 3132-3137, 2018
212018
Asymmetric interface broadening in epitaxial Mo/W (001) superlattices grown by magnetron sputtering
EB Svedberg, J Birch, I Ivanov, EP Münger, JE Sundgren
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 16 (2 …, 1998
211998
Enhanced cluster mobilities on Pt (111) during film growth from the vapor phase
V Chirita, EP Münger, JE Sundgren, JE Greene
Applied physics letters 72 (1), 127-129, 1998
201998
Cluster diffusion and surface morphological transitions on Pt (111) via reptation and concerted motion
V Chirita, EP Münger, JE Greene, JE Sundgren
Thin Solid Films 370 (1-2), 179-185, 2000
192000
Adatom-induced diffusion of two-dimensional close-packed Pt7 clusters on Pt (111)
EP Münger, V Chirita, JE Greene, JE Sundgren
Surface science 355 (1-3), L325-L330, 1996
191996
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