| Robust and accurate line-and/or point-based pose estimation without manhattan assumptions Y Salaün, R Marlet, P Monasse European Conference on Computer Vision, 801-818, 2016 | 22 | 2016 |
| Multiscale line segment detector for robust and accurate SfM Y Salaün, R Marlet, P Monasse 2016 23rd International Conference on Pattern Recognition (ICPR), 2000-2005, 2016 | 19 | 2016 |
| Line-based robust SfM with little image overlap Y Salaün, R Marlet, P Monasse 2017 International Conference on 3D Vision (3DV), 195-204, 2017 | 10 | 2017 |
| The Multiscale Line Segment Detector Y Salaün, R Marlet, P Monasse International Workshop on Reproducible Research in Pattern Recognition, 167-178, 2016 | 2 | 2016 |
| Line-based Robust SfM with Little Image Overlap—Supplementary Material— Y Salaün, R Marlet, P Monasse | | |
| Robust and Accurate Line-and Point-Based Pose Estimation without Manhattan Assumptions—Supplementary Material— Y Salaün, R Marlet, P Monasse | | |
Renaud MarletSenior researcher at Ecole des Ponts ParisTech (ENPC) / Principal Scientist at Valeo.aiVerified email at enpc.fr
